SRF2021 - List of Authors (Oseroff, T.E.)

Paper	Title	Page
TUOFDV07	Sample Test Systems for Next-Gen SRF Surfaces	357
	T.E. Oseroff, M. Liepe, Z. Sun Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
	With the increasing worldwide focus on the development of new surfaces for SRF cavities, exploring alternative materials and multilayer structures, test systems that allow measuring the RF performance of simple sample geometries (e.g., flat samples) become increasingly essential. These systems provide RF performance results that are needed to guide the development of these surfaces. This contribution gives an overview of sample test systems currently available, including the improved Cornell sample host cavity. Recent advances in this important technology, performance specifications, and current limitations are discussed. In addition, an overview is given of interesting recent RF performance results on samples coated with non-niobium bulk and multilayer films.
DOI •	reference for this paper ※ doi:10.18429/JACoW-SRF2021-TUOFDV07
About •	Received ※ 08 July 2021 — Accepted ※ 21 August 2021 — Issue date ※ 05 September 2021
Cite •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEPTEV012	Characterization of Atomic-Layer-Deposited NbTiN and NbTiN/AlN Films for SIS Multilayer Structures	662
	Z. Sun, M. Liepe, T.E. Oseroff Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA X. Deng University of Virginia, Charlottesville, Virginia, USA
	SIS (superconductor-insulator-superconductor) mul-tilayer structures are proposed designs to repel early flux penetration and ease the impact of defects in SRF cavities. The demonstration of such device physics is strongly affected by the film qualities ’ material struc-ture and composition. Here, we characterized 100 nm NbTiN / 2 nm AlN / bulk Nb SIS structures and investigated the effect of the presence of the AlN layer on the NbTiN film properties. We find that the hcp-structured AlN layer results in a Nb composition gra-dient as a function of film depth, whereas the Nb con-centration remains constant in the NbTiN/Nb samples, which suggests that interface mismatch could induce significant change in NbTiN composition. The surface composition variation further leads to different oxide structures, which might impact the superconducting performance. Our observations indicate that the choice of the insulating layer in SIS structures is critical, and that interface mismatch together with internal strain could deteriorate the superconducting film.
DOI •	reference for this paper ※ doi:10.18429/JACoW-SRF2021-WEPTEV012
About •	Received ※ 08 July 2021 — Revised ※ 06 August 2021 — Accepted ※ 22 November 2021 — Issue date ※ 02 January 2022
Cite •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEOTEV03	Toward Stoichiometric and Low-Surface-Roughness Nb₃Sn Thin Films via Direct Electrochemical Deposition	710
	Z. Sun, G. Gaitan, M. Ge, K. Howard, M. Liepe, T.E. Oseroff, R.D. Porter Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA T. Arias, Z. Baraissov, M.M. Kelley, D.A. Muller, J.P. Sethna, N. Sitaraman Cornell University, Ithaca, New York, USA K.D. Dobson University of Delaware, Newark, Delaware, USA
	Reducing surface roughness and attaining stoichiometry of Nb₃Sn superconducting films are required to push their superheating field to the theoretical limit in SRF cavities. As such, we explore direct electrochemical processes that minimize involving foreign elements to deposit high-quality Sn, Nb, and NbxSn films on Nb and Cu surfaces. These films are then thermally annealed to Nb₃Sn. We find that smooth Sn pre-depositions via electroplating on Nb surfaces significantly reduce the average roughness of resultant Nb₃Sn to 65 nm, with a dramatic reduction in power intensity at medium special frequencies. Structural and superconducting properties demonstrate a Nb₃Sn A15 phase with a stoichiometry of 25 at% Sn. This process is being scaled-up to a 3.9 GHz cavity. Moreover, preliminary results on electroplating on Cu surface show that Nb plating undergoes a slow growth rate while subsequent Sn plating on the plated Nb surface can be controlled with varied thickness. The Nb plating process is currently being optimized.
DOI •	reference for this paper ※ doi:10.18429/JACoW-SRF2021-WEOTEV03
About •	Received ※ 09 July 2021 — Revised ※ 09 August 2021 — Accepted ※ 21 August 2021 — Issue date ※ 16 January 2022
Cite •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

THPTEV004	Surface Oxides on Nb and Nb₃Sn Surfaces: Toward a Deeper Understanding	836
	Z. Sun, M. Liepe, T.E. Oseroff, R.D. Porter Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA T. Arias, Z. Baraissov, D.A. Muller, N. Sitaraman Cornell University, Ithaca, New York, USA C. Dukes University of Virginia, Charlottesville, Virginia, USA D. Johnson-McDaniel, M. Salim CCMR, Ithaca, New York, USA
	Surface oxides on Nb and Nb₃Sn SRF cavities, as a thin ’dirty’ layer, could be critical to their performance as suggested by recent theory. Although these oxides have been studied in the past, we intend here to provide a deeper understanding based on a systematic study on coupon samples that have been processed under the different conditions currently used in SRF cavity treatments. Our aim is to obtain a more complete picture of the oxide evolution. This then might help to explain the observed cavity performance variation, and might allow designing a process to achieve a designed, optimized surface with controlled oxides types and thickness. We find that the surface oxides are in amorphous phase that exhibits normal conducting behaviors, while the pentoxide further degrades with time. Also, we observed a thin hydroxide layer on the outermost surface and possibly Nb(OH)x motifs in the bulk. Moreover, distinctive oxide structures were found in Nb₃Sn samples from vapor diffusion, electroplating, and sputtering. The semiconducting SnOx appeared through the oxide depth in vapor diffused Nb₃Sn, while a ~1 nm SnOx layer merely exists at the outermost surface of electroplated Nb₃Sn.
DOI •	reference for this paper ※ doi:10.18429/JACoW-SRF2021-THPTEV004
About •	Received ※ 09 July 2021 — Revised ※ 11 August 2021 — Accepted ※ 21 August 2021 — Issue date ※ 04 November 2021
Cite •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

Sample Test Systems for Next-Gen SRF Surfaces

357

T.E. Oseroff, M. Liepe, Z. Sun
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA

With the increasing worldwide focus on the development of new surfaces for SRF cavities, exploring alternative materials and multilayer structures, test systems that allow measuring the RF performance of simple sample geometries (e.g., flat samples) become increasingly essential. These systems provide RF performance results that are needed to guide the development of these surfaces. This contribution gives an overview of sample test systems currently available, including the improved Cornell sample host cavity. Recent advances in this important technology, performance specifications, and current limitations are discussed. In addition, an overview is given of interesting recent RF performance results on samples coated with non-niobium bulk and multilayer films.

DOI •

reference for this paper ※ doi:10.18429/JACoW-SRF2021-TUOFDV07

About •

Received ※ 08 July 2021 — Accepted ※ 21 August 2021 — Issue date ※ 05 September 2021

Cite •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEPTEV012

Characterization of Atomic-Layer-Deposited NbTiN and NbTiN/AlN Films for SIS Multilayer Structures

662

Z. Sun, M. Liepe, T.E. Oseroff
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
X. Deng
University of Virginia, Charlottesville, Virginia, USA

SIS (superconductor-insulator-superconductor) mul-tilayer structures are proposed designs to repel early flux penetration and ease the impact of defects in SRF cavities. The demonstration of such device physics is strongly affected by the film qualities ’ material struc-ture and composition. Here, we characterized 100 nm NbTiN / 2 nm AlN / bulk Nb SIS structures and investigated the effect of the presence of the AlN layer on the NbTiN film properties. We find that the hcp-structured AlN layer results in a Nb composition gra-dient as a function of film depth, whereas the Nb con-centration remains constant in the NbTiN/Nb samples, which suggests that interface mismatch could induce significant change in NbTiN composition. The surface composition variation further leads to different oxide structures, which might impact the superconducting performance. Our observations indicate that the choice of the insulating layer in SIS structures is critical, and that interface mismatch together with internal strain could deteriorate the superconducting film.

DOI •

reference for this paper ※ doi:10.18429/JACoW-SRF2021-WEPTEV012

About •

Received ※ 08 July 2021 — Revised ※ 06 August 2021 — Accepted ※ 22 November 2021 — Issue date ※ 02 January 2022

Cite •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEOTEV03

Toward Stoichiometric and Low-Surface-Roughness Nb₃Sn Thin Films via Direct Electrochemical Deposition

710

Z. Sun, G. Gaitan, M. Ge, K. Howard, M. Liepe, T.E. Oseroff, R.D. Porter
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
T. Arias, Z. Baraissov, M.M. Kelley, D.A. Muller, J.P. Sethna, N. Sitaraman
Cornell University, Ithaca, New York, USA
K.D. Dobson
University of Delaware, Newark, Delaware, USA

Reducing surface roughness and attaining stoichiometry of Nb₃Sn superconducting films are required to push their superheating field to the theoretical limit in SRF cavities. As such, we explore direct electrochemical processes that minimize involving foreign elements to deposit high-quality Sn, Nb, and NbxSn films on Nb and Cu surfaces. These films are then thermally annealed to Nb₃Sn. We find that smooth Sn pre-depositions via electroplating on Nb surfaces significantly reduce the average roughness of resultant Nb₃Sn to 65 nm, with a dramatic reduction in power intensity at medium special frequencies. Structural and superconducting properties demonstrate a Nb₃Sn A15 phase with a stoichiometry of 25 at% Sn. This process is being scaled-up to a 3.9 GHz cavity. Moreover, preliminary results on electroplating on Cu surface show that Nb plating undergoes a slow growth rate while subsequent Sn plating on the plated Nb surface can be controlled with varied thickness. The Nb plating process is currently being optimized.

DOI •

reference for this paper ※ doi:10.18429/JACoW-SRF2021-WEOTEV03

About •

Received ※ 09 July 2021 — Revised ※ 09 August 2021 — Accepted ※ 21 August 2021 — Issue date ※ 16 January 2022

Cite •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

THPTEV004

Surface Oxides on Nb and Nb₃Sn Surfaces: Toward a Deeper Understanding

836

Z. Sun, M. Liepe, T.E. Oseroff, R.D. Porter
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
T. Arias, Z. Baraissov, D.A. Muller, N. Sitaraman
Cornell University, Ithaca, New York, USA
C. Dukes
University of Virginia, Charlottesville, Virginia, USA
D. Johnson-McDaniel, M. Salim
CCMR, Ithaca, New York, USA

Surface oxides on Nb and Nb₃Sn SRF cavities, as a thin ’dirty’ layer, could be critical to their performance as suggested by recent theory. Although these oxides have been studied in the past, we intend here to provide a deeper understanding based on a systematic study on coupon samples that have been processed under the different conditions currently used in SRF cavity treatments. Our aim is to obtain a more complete picture of the oxide evolution. This then might help to explain the observed cavity performance variation, and might allow designing a process to achieve a designed, optimized surface with controlled oxides types and thickness. We find that the surface oxides are in amorphous phase that exhibits normal conducting behaviors, while the pentoxide further degrades with time. Also, we observed a thin hydroxide layer on the outermost surface and possibly Nb(OH)x motifs in the bulk. Moreover, distinctive oxide structures were found in Nb₃Sn samples from vapor diffusion, electroplating, and sputtering. The semiconducting SnOx appeared through the oxide depth in vapor diffused Nb₃Sn, while a ~1 nm SnOx layer merely exists at the outermost surface of electroplated Nb₃Sn.

DOI •

reference for this paper ※ doi:10.18429/JACoW-SRF2021-THPTEV004

About •

Received ※ 09 July 2021 — Revised ※ 11 August 2021 — Accepted ※ 21 August 2021 — Issue date ※ 04 November 2021

Cite •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)