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RIS citation export for WEPTEV012: Characterization of Atomic-Layer-Deposited NbTiN and NbTiN/AlN Films for SIS Multilayer Structures

TY  - CONF
AU  - Sun, Z.
AU  - Deng, X.
AU  - Liepe, M.
AU  - Oseroff, T.E.
ED  - Saito, Kenji
ED  - Xu, Ting
ED  - Sakamoto, Naruhiko
ED  - Lesage, Ana
ED  - Schaa, Volker R.W.
TI  - Characterization of Atomic-Layer-Deposited NbTiN and NbTiN/AlN Films for SIS Multilayer Structures
J2  - Proc. of SRF2021, East Lansing, MI, USA, 28 June-02 July 2021
CY  - East Lansing, MI, USA
T2  - International Conference on RF Superconductivity
T3  - 20
LA  - english
AB  - SIS (superconductor-insulator-superconductor) mul-tilayer structures are proposed designs to repel early flux penetration and ease the impact of defects in SRF cavities. The demonstration of such device physics is strongly affected by the film qualities ’ material struc-ture and composition. Here, we characterized 100 nm NbTiN / 2 nm AlN / bulk Nb SIS structures and investigated the effect of the presence of the AlN layer on the NbTiN film properties. We find that the hcp-structured AlN layer results in a Nb composition gra-dient as a function of film depth, whereas the Nb con-centration remains constant in the NbTiN/Nb samples, which suggests that interface mismatch could induce significant change in NbTiN composition. The surface composition variation further leads to different oxide structures, which might impact the superconducting performance. Our observations indicate that the choice of the insulating layer in SIS structures is critical, and that interface mismatch together with internal strain could deteriorate the superconducting film.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 662
EP  - 665
KW  - interface
KW  - SRF
KW  - site
KW  - cavity
KW  - superconductivity
DA  - 2022/10
PY  - 2022
SN  - 2673-5504
SN  - 978-3-95450-233-2
DO  - doi:10.18429/JACoW-SRF2021-WEPTEV012
UR  - https://jacow.org/srf2021/papers/weptev012.pdf
ER  -