JACoW is a publisher in Geneva, Switzerland that publishes the proceedings of accelerator conferences held around the world by an international collaboration of editors.
@inproceedings{oseroff:srf2021-tuofdv07,
author = {T.E. Oseroff and M. Liepe and Z. Sun},
title = {{Sample Test Systems for Next-Gen SRF Surfaces}},
booktitle = {Proc. SRF'21},
% booktitle = {Proc. 20th International Conference on RF Superconductivity (SRF'21)},
pages = {357--364},
eid = {TUOFDV07},
language = {english},
keywords = {cavity, SRF, niobium, operation, quadrupole},
venue = {East Lansing, MI, USA},
series = {International Conference on RF Superconductivity},
number = {20},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {10},
year = {2022},
issn = {2673-5504},
isbn = {978-3-95450-233-2},
doi = {10.18429/JACoW-SRF2021-TUOFDV07},
url = {https://jacow.org/srf2021/papers/tuofdv07.pdf},
abstract = {{With the increasing worldwide focus on the development of new surfaces for SRF cavities, exploring alternative materials and multilayer structures, test systems that allow measuring the RF performance of simple sample geometries (e.g., flat samples) become increasingly essential. These systems provide RF performance results that are needed to guide the development of these surfaces. This contribution gives an overview of sample test systems currently available, including the improved Cornell sample host cavity. Recent advances in this important technology, performance specifications, and current limitations are discussed. In addition, an overview is given of interesting recent RF performance results on samples coated with non-niobium bulk and multilayer films.}},
}