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RIS citation export for THPTEV004: Surface Oxides on Nb and Nb₃Sn Surfaces: Toward a Deeper Understanding

TY  - CONF
AU  - Sun, Z.
AU  - Arias, T.
AU  - Baraissov, Z.
AU  - Dukes, C.
AU  - Johnson-McDaniel, D.
AU  - Liepe, M.
AU  - Muller, D.A.
AU  - Oseroff, T.E.
AU  - Porter, R.D.
AU  - Salim, M.
AU  - Sitaraman, N.
ED  - Saito, Kenji
ED  - Xu, Ting
ED  - Sakamoto, Naruhiko
ED  - Lesage, Ana
ED  - Schaa, Volker R.W.
TI  - Surface Oxides on Nb and Nb₃Sn Surfaces: Toward a Deeper Understanding
J2  - Proc. of SRF2021, East Lansing, MI, USA, 28 June-02 July 2021
CY  - East Lansing, MI, USA
T2  - International Conference on RF Superconductivity
T3  - 20
LA  - english
AB  - Surface oxides on Nb and Nb₃Sn SRF cavities, as a thin ’dirty’ layer, could be critical to their performance as suggested by recent theory. Although these oxides have been studied in the past, we intend here to provide a deeper understanding based on a systematic study on coupon samples that have been processed under the different conditions currently used in SRF cavity treatments. Our aim is to obtain a more complete picture of the oxide evolution. This then might help to explain the observed cavity performance variation, and might allow designing a process to achieve a designed, optimized surface with controlled oxides types and thickness. We find that the surface oxides are in amorphous phase that exhibits normal conducting behaviors, while the pentoxide further degrades with time. Also, we observed a thin hydroxide layer on the outermost surface and possibly Nb(OH)x motifs in the bulk. Moreover, distinctive oxide structures were found in Nb₃Sn samples from vapor diffusion, electroplating, and sputtering. The semiconducting SnOx appeared through the oxide depth in vapor diffused Nb₃Sn, while a ~1 nm SnOx layer merely exists at the outermost surface of electroplated Nb₃Sn.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 836
EP  - 840
KW  - SRF
KW  - niobium
KW  - cavity
KW  - superconductivity
KW  - electron
DA  - 2022/10
PY  - 2022
SN  - 2673-5504
SN  - 978-3-95450-233-2
DO  - doi:10.18429/JACoW-SRF2021-THPTEV004
UR  - https://jacow.org/srf2021/papers/thptev004.pdf
ER  -