Author: Rosaz, G.J.
Paper Title Page
TUXAA02 HIE Isolde Cavity Production & Cryomodule Commissioning, Lessons Learned 338
 
  • W. Venturini Delsolaro, K. Artoos, O. Brunner, O. Capatina, K.M. Dr. Schirm, Y. Kadi, Y. Leclercq, A. Miyazaki, E. Montesinos, V. Parma, G.J. Rosaz, A. Sublet, S. Teixeira Lopez, M. Therasse, L.R. Williams
    CERN, Geneva, Switzerland
  
  The lessons learned during the HIE Isolde Cavity Production, the Cryo Module Assembly and Commissioning will be presented  
slides icon Slides TUXAA02 [8.191 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2017-TUXAA02  
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WEXA04
 SRF Cavity Coatings: Review of Alternative Materials and Coating Techniques  
 
  • G.J. Rosaz, S. Aull, E.A. Ilyina, A. Sublet, W. Venturini Delsolaro
    CERN, Geneva, Switzerland
  
  R/D is ongoing at CERN to study A15 coatings on copper substrates for applications on SRF cavities, in particular for future large accelerators like the FCC. The presentation will give an overview of the techniques and of the main results achieved so far  
slides icon Slides WEXA04 [33.223 MB]  
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THPB048 Double Cathode Configuration for the Nb Coating of HIE-ISOLDE Cavities 854
 
  • A. Awais
    NCP, Islamabad, Pakistan
  • A. Awais, A.J.G. Lunt, G.J. Rosaz, A. Sublet, M. Taborelli
    CERN, Geneva, Switzerland
  
  The Quarter Wave Resonator (QWR) cavities for HIE-ISOLDE project at CERN have entered their ending phase of production. Some R&D is still required to improve the uniformity of the Nb layer thickness on the cavity surface. In order to improve this behaviour one approach which has been proposed is to replace the single cathode with a double cathode and test the suitability of different deposition techniques. With this change it is possible to control the plasma and power distribution separately for the inner and outer part of cavity and thereby potentially improve film uniformity throughout the cavity and coating duration. In this study a comparison between the deposition rates obtained using a single cathode and a double cathode using Direct Current (DC)-bias diode sputtering, DC-magnetron sputtering (DCMS) and Pulsed DC-magnetron sputtering (PDCMS) is presented. The morphology of the thin film samples were compared using Focused Ion Beam (FIB) cross section milling and Scanning Electron Microscopy (SEM) analysis.  
poster icon Poster THPB048 [3.715 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2017-THPB048  
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