IBIC2013 - List of Authors (Rehm, G.)

Paper

Title

Page

Longitudinal Beam Profile Monitor for Investigating the Microbunching Instability at Diamond Light Source

143

W. Shields, R. Bartolini, A.F.D. Morgan, G. Rehm
Diamond, Oxfordshire, United Kingdom
R. Bartolini, P. Karataev
JAI, Egham, Surrey, United Kingdom
P. Karataev
Royal Holloway, University of London, Surrey, United Kingdom

An investigation into the microbunching instability at Diamond Light Source has recently been conducted. Beyond the instability threshold, the bunch emits bursts of coherent synchrotron radiation with wavelengths comparable to the bunch length or shorter. The operating conditions for producing the instability include both normal optics, and low-alpha optics, where the bunch length can be shortened to a few picoseconds. A Michelson interferometer has been designed and installed utilising a silicon crystal wafer beamsplitter. Large bandwidth, room temperature pyroelectric detectors and low-noise, fast-response Schottky Barrier diode detectors have been employed to generate interferograms. In this paper, we describe the observed spectral content and the resulting calculated bunch length.

MOPF23

Quantifying Dissipated Power From Wake Field Losses in Diagnostics Structures

259

A.F.D. Morgan, G. Rehm
Diamond, Oxfordshire, United Kingdom

As a charged particle beam passes through structures, wake fields can deposit a fraction of the energy carried by the beam as characterised by the wake loss factor. Some part of the deposited energy will be emitted into the beam pipe, some part can be coupled out of signal ports and some part will be absorbed by the materials of the structures. With increasingly higher stored currents, we require a better understanding of where all the energy deposited by wake losses ends up in order to avoid damaging components. This is of particular concern for diagnostics structures as they are often designed to couple a small fraction of energy from the beam, which makes them susceptible to thermal damage due to increased localised losses. We will detail the simulation and analysis approach which we have developed to quantify power deposition within structures. As an example the analysis of a beam position monitor pickup block of the Diamond storage ring is shown.

Poster MOPF23 [0.249 MB]

TUPC10

Operation of Diamond Light Source XBPMs with Zero Bias

376

C. Bloomer, G. Rehm
Diamond, Oxfordshire, United Kingdom

Tungsten blade X-ray Beam Position Monitors (XBPMs) have been used at Diamond Light Source since 2007, however a long-standing problem with these devices has been the growth of leakage current through the ceramic insulation within the XBPMs over time, often becoming greater than 10% of the signal current after a few years of operation. The growth of these leakage currents has been found to be exacerbated by the application of a negative bias (-70V) to the tungsten blades, a bias suggested for optimum position sensitivity. This bias is applied in order to accelerate free electrons away from the surface of the blades and to prevent cross-talk, however, we have found that the operation of the XBPMs without bias has negligible impact on our measurements. Removal of the bias has been found to prevent the growth of leakage currents over time, and can also significantly reduce the cost of our signal acquisition by removing the need for a low-current amplifier with a bias supply.

Poster TUPC10 [0.455 MB]

TUPC11

Beam-Based Measurement of ID Taper Impedance at Diamond

380

V.V. Smaluk, R. Bartolini, R.T. Fielder, G. Rehm
Diamond, Oxfordshire, United Kingdom

New insertion devices (IDs) are being designed now for a Diamond upgrade. One of the important topics of the design is the coupling impedance of the ID vacuum chamber movable tapers. To get a complete and reliable information of the impedance, analytical estimations, numerical simulation and beam-based measurement have been performed. The impedance of an existing ID taper geometrically similar to the new one has been measured using the orbit bump method. It turns out that in spite of the small magnitude (a few um) of orbit distortion to be observed in this case, the BPM resolution is sufficient for this measurement. The measurement results in comparison with simulation data are discussed in this paper.

WEAL1

Large Aperture X-ray Monitors for Beam Profile Diagnostics

608

C.A. Thomas, G. Rehm
Diamond, Oxfordshire, United Kingdom
F. Ewald
ESRF, Grenoble, France
J.W. Flanagan
KEK, Ibaraki, Japan

Emittance is one of the main characteristic properties of a beam of particles in an accelerator, and it is measured generally by means of the particle beam profile. In particular, when the beam of particles is emitting an X-ray photon beam, a non perturbative way of measuring the particle beam profile is to image it using the emitted X-ray photon beam. Over the years, numerous X-ray imaging methods have been developed, fulfilling the requirements imposed by a particle beam becoming smaller, and approaching micron size for electron beam machine with vertical emittance of the order of 1pm-rad. In this paper, we will first recall the properties of the X-ray photon as function of source and its properties. From this we will derive some natural definition of a large aperture X-ray imaging system. We will then use this selection criterion to select a number of X-ray imaging devices used as a beam profile diagnostics in an attempt to give an overview of what has been achieved and what is possible to achieve with the selected devices.

Slides WEAL1 [7.499 MB]

WEPC10

Capability Upgrade of the Diamond Transverse Multibunch Feedback

682

M.G. Abbott, G. Rehm, I.S. Uzun
Diamond, Oxfordshire, United Kingdom

We describe an upgrade to the Transverse Multi-Bunch Feedback processor used at Diamond for control of multi-bunch instabilities and measurement of betatron tunes. The new system will improve both feedback and diagnostic capabilities. Bunch by bunch selectable control over feedback filters, gain and excitation will allow finer control over feedback, allowing for example the single bunch in a hybrid or camshaft fill pattern to be controlled independently from the bunch train. It will also be possible to excite all bunches at a single frequency while simultaneously sweeping the excitation for tune measurement of a few selected bunches. The single frequency excitation can be used for bunch cleaning or continuous measurement of the beta-function. A simple programmable event sequencer will provide support for up to 8 steps of programmable sweeps and changes to feedback and excitation, allowing a variety of complex and precisely timed beam characterisation experiments including grow-damp measurements in unstable conditions.

Poster WEPC10 [0.427 MB]

Paper	Title	Page
MOPC34	Longitudinal Beam Profile Monitor for Investigating the Microbunching Instability at Diamond Light Source	143
	W. Shields, R. Bartolini, A.F.D. Morgan, G. Rehm Diamond, Oxfordshire, United Kingdom R. Bartolini, P. Karataev JAI, Egham, Surrey, United Kingdom P. Karataev Royal Holloway, University of London, Surrey, United Kingdom
	An investigation into the microbunching instability at Diamond Light Source has recently been conducted. Beyond the instability threshold, the bunch emits bursts of coherent synchrotron radiation with wavelengths comparable to the bunch length or shorter. The operating conditions for producing the instability include both normal optics, and low-alpha optics, where the bunch length can be shortened to a few picoseconds. A Michelson interferometer has been designed and installed utilising a silicon crystal wafer beamsplitter. Large bandwidth, room temperature pyroelectric detectors and low-noise, fast-response Schottky Barrier diode detectors have been employed to generate interferograms. In this paper, we describe the observed spectral content and the resulting calculated bunch length.

MOPF23	Quantifying Dissipated Power From Wake Field Losses in Diagnostics Structures	259
	A.F.D. Morgan, G. Rehm Diamond, Oxfordshire, United Kingdom
	As a charged particle beam passes through structures, wake fields can deposit a fraction of the energy carried by the beam as characterised by the wake loss factor. Some part of the deposited energy will be emitted into the beam pipe, some part can be coupled out of signal ports and some part will be absorbed by the materials of the structures. With increasingly higher stored currents, we require a better understanding of where all the energy deposited by wake losses ends up in order to avoid damaging components. This is of particular concern for diagnostics structures as they are often designed to couple a small fraction of energy from the beam, which makes them susceptible to thermal damage due to increased localised losses. We will detail the simulation and analysis approach which we have developed to quantify power deposition within structures. As an example the analysis of a beam position monitor pickup block of the Diamond storage ring is shown.
	Poster MOPF23 [0.249 MB]

TUPC10	Operation of Diamond Light Source XBPMs with Zero Bias	376
	C. Bloomer, G. Rehm Diamond, Oxfordshire, United Kingdom
	Tungsten blade X-ray Beam Position Monitors (XBPMs) have been used at Diamond Light Source since 2007, however a long-standing problem with these devices has been the growth of leakage current through the ceramic insulation within the XBPMs over time, often becoming greater than 10% of the signal current after a few years of operation. The growth of these leakage currents has been found to be exacerbated by the application of a negative bias (-70V) to the tungsten blades, a bias suggested for optimum position sensitivity. This bias is applied in order to accelerate free electrons away from the surface of the blades and to prevent cross-talk, however, we have found that the operation of the XBPMs without bias has negligible impact on our measurements. Removal of the bias has been found to prevent the growth of leakage currents over time, and can also significantly reduce the cost of our signal acquisition by removing the need for a low-current amplifier with a bias supply.
	Poster TUPC10 [0.455 MB]

TUPC11	Beam-Based Measurement of ID Taper Impedance at Diamond	380
	V.V. Smaluk, R. Bartolini, R.T. Fielder, G. Rehm Diamond, Oxfordshire, United Kingdom
	New insertion devices (IDs) are being designed now for a Diamond upgrade. One of the important topics of the design is the coupling impedance of the ID vacuum chamber movable tapers. To get a complete and reliable information of the impedance, analytical estimations, numerical simulation and beam-based measurement have been performed. The impedance of an existing ID taper geometrically similar to the new one has been measured using the orbit bump method. It turns out that in spite of the small magnitude (a few um) of orbit distortion to be observed in this case, the BPM resolution is sufficient for this measurement. The measurement results in comparison with simulation data are discussed in this paper.

WEAL1	Large Aperture X-ray Monitors for Beam Profile Diagnostics	608
	C.A. Thomas, G. Rehm Diamond, Oxfordshire, United Kingdom F. Ewald ESRF, Grenoble, France J.W. Flanagan KEK, Ibaraki, Japan
	Emittance is one of the main characteristic properties of a beam of particles in an accelerator, and it is measured generally by means of the particle beam profile. In particular, when the beam of particles is emitting an X-ray photon beam, a non perturbative way of measuring the particle beam profile is to image it using the emitted X-ray photon beam. Over the years, numerous X-ray imaging methods have been developed, fulfilling the requirements imposed by a particle beam becoming smaller, and approaching micron size for electron beam machine with vertical emittance of the order of 1pm-rad. In this paper, we will first recall the properties of the X-ray photon as function of source and its properties. From this we will derive some natural definition of a large aperture X-ray imaging system. We will then use this selection criterion to select a number of X-ray imaging devices used as a beam profile diagnostics in an attempt to give an overview of what has been achieved and what is possible to achieve with the selected devices.
	Slides WEAL1 [7.499 MB]

WEPC10	Capability Upgrade of the Diamond Transverse Multibunch Feedback	682
	M.G. Abbott, G. Rehm, I.S. Uzun Diamond, Oxfordshire, United Kingdom
	We describe an upgrade to the Transverse Multi-Bunch Feedback processor used at Diamond for control of multi-bunch instabilities and measurement of betatron tunes. The new system will improve both feedback and diagnostic capabilities. Bunch by bunch selectable control over feedback filters, gain and excitation will allow finer control over feedback, allowing for example the single bunch in a hybrid or camshaft fill pattern to be controlled independently from the bunch train. It will also be possible to excite all bunches at a single frequency while simultaneously sweeping the excitation for tune measurement of a few selected bunches. The single frequency excitation can be used for bunch cleaning or continuous measurement of the beta-function. A simple programmable event sequencer will provide support for up to 8 steps of programmable sweeps and changes to feedback and excitation, allowing a variety of complex and precisely timed beam characterisation experiments including grow-damp measurements in unstable conditions.
	Poster WEPC10 [0.427 MB]