Keyword: electronics
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WEP2PO032 A Secondary Emission Monitor in the SINQ Beam Line for Improved Target Protection target, electron, proton, GUI 334
 
  • R. Dölling, M. Rohrer
    PSI, Villigen PSI, Switzerland
 
  A 4-strip secondary-emission monitor (SEM) has been installed in the beam line to the SINQ neutron source to detect irregular fractions of the megawatt proton beam which might damage the spallation target. We discuss the estimated performance of the monitor as well as its design and implementation.

 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-HB2018-WEP2PO032  
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