IBIC2013 - List of Authors (Flanagan, J.W.)

Paper

Title

Page

Beam Diagnostics of SuperKEKB Damping Ring

53

H. Ikeda, A. Arinaga, J.W. Flanagan, H. Fukuma, H. Ishii, S. Kanaeda, K. Mori, M. Tejima, M. Tobiyama
KEK, Ibaraki, Japan

The KEKB accelerator ceased operation in 2010, and is being upgraded to SuperKEKB. Adopting low emittance and high current beams, the design luminosity is set at 40 times larger than that of KEKB. We are constructing a damping ring (DR) in order to achieve a low-emittance positron beam for injection. Turn-by-turn beam position monitors (BPMs), a transverse feedback system, a synchrotron radiation monitor (SRM), a DCCT, loss monitors using ion chambers, a bunch current monitor and a tune meter will be installed for beam diagnostics at the DR. An overview of the instrumentation of the DR will be presented in this paper.

WEAL1

Large Aperture X-ray Monitors for Beam Profile Diagnostics

608

C.A. Thomas, G. Rehm
Diamond, Oxfordshire, United Kingdom
F. Ewald
ESRF, Grenoble, France
J.W. Flanagan
KEK, Ibaraki, Japan

Emittance is one of the main characteristic properties of a beam of particles in an accelerator, and it is measured generally by means of the particle beam profile. In particular, when the beam of particles is emitting an X-ray photon beam, a non perturbative way of measuring the particle beam profile is to image it using the emitted X-ray photon beam. Over the years, numerous X-ray imaging methods have been developed, fulfilling the requirements imposed by a particle beam becoming smaller, and approaching micron size for electron beam machine with vertical emittance of the order of 1pm-rad. In this paper, we will first recall the properties of the X-ray photon as function of source and its properties. From this we will derive some natural definition of a large aperture X-ray imaging system. We will then use this selection criterion to select a number of X-ray imaging devices used as a beam profile diagnostics in an attempt to give an overview of what has been achieved and what is possible to achieve with the selected devices.

Slides WEAL1 [7.499 MB]

WEPF15

High-Power Tests at CesrTA of X-ray Optics Elements for SuperKEKB

844

J.W. Flanagan, A. Arinaga, H. Fukuma, H. Ikeda
KEK, Ibaraki, Japan
A. Lyndaker, D.P. Peterson, N.T. Rider
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA

X-ray beam size monitors at SuperKEKB must withstand high, sustained incident power loads. Two prototype optics elements were fabricated and tested at CesrTA, using incident X-ray power densities comparable to those expected at the SuperKEKB LER. One element was based on a silicon substrate, the other a CVD diamond substrate, with each substrate supporting a coded aperture mask pattern in gold on its surface. The diamond substrate mask showed superior performance to the silicon substrate mask, with the the mask pattern on the silicon substrate melting at the highest incident power level tested, where the diamond-substrate mask survived. We will present here the high-power test results, along with analysis of X-ray power absorption and heat transfer in the two prototype elements, and the resulting implications for the design of the optics, beam line and heat sink for SuperKEKB.

Paper	Title	Page
MOPC05	Beam Diagnostics of SuperKEKB Damping Ring	53
	H. Ikeda, A. Arinaga, J.W. Flanagan, H. Fukuma, H. Ishii, S. Kanaeda, K. Mori, M. Tejima, M. Tobiyama KEK, Ibaraki, Japan
	The KEKB accelerator ceased operation in 2010, and is being upgraded to SuperKEKB. Adopting low emittance and high current beams, the design luminosity is set at 40 times larger than that of KEKB. We are constructing a damping ring (DR) in order to achieve a low-emittance positron beam for injection. Turn-by-turn beam position monitors (BPMs), a transverse feedback system, a synchrotron radiation monitor (SRM), a DCCT, loss monitors using ion chambers, a bunch current monitor and a tune meter will be installed for beam diagnostics at the DR. An overview of the instrumentation of the DR will be presented in this paper.

WEAL1	Large Aperture X-ray Monitors for Beam Profile Diagnostics	608
	C.A. Thomas, G. Rehm Diamond, Oxfordshire, United Kingdom F. Ewald ESRF, Grenoble, France J.W. Flanagan KEK, Ibaraki, Japan
	Emittance is one of the main characteristic properties of a beam of particles in an accelerator, and it is measured generally by means of the particle beam profile. In particular, when the beam of particles is emitting an X-ray photon beam, a non perturbative way of measuring the particle beam profile is to image it using the emitted X-ray photon beam. Over the years, numerous X-ray imaging methods have been developed, fulfilling the requirements imposed by a particle beam becoming smaller, and approaching micron size for electron beam machine with vertical emittance of the order of 1pm-rad. In this paper, we will first recall the properties of the X-ray photon as function of source and its properties. From this we will derive some natural definition of a large aperture X-ray imaging system. We will then use this selection criterion to select a number of X-ray imaging devices used as a beam profile diagnostics in an attempt to give an overview of what has been achieved and what is possible to achieve with the selected devices.
	Slides WEAL1 [7.499 MB]

WEPF15	High-Power Tests at CesrTA of X-ray Optics Elements for SuperKEKB	844
	J.W. Flanagan, A. Arinaga, H. Fukuma, H. Ikeda KEK, Ibaraki, Japan A. Lyndaker, D.P. Peterson, N.T. Rider Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
	X-ray beam size monitors at SuperKEKB must withstand high, sustained incident power loads. Two prototype optics elements were fabricated and tested at CesrTA, using incident X-ray power densities comparable to those expected at the SuperKEKB LER. One element was based on a silicon substrate, the other a CVD diamond substrate, with each substrate supporting a coded aperture mask pattern in gold on its surface. The diamond substrate mask showed superior performance to the silicon substrate mask, with the the mask pattern on the silicon substrate melting at the highest incident power level tested, where the diamond-substrate mask survived. We will present here the high-power test results, along with analysis of X-ray power absorption and heat transfer in the two prototype elements, and the resulting implications for the design of the optics, beam line and heat sink for SuperKEKB.