NAPAC2019 - List of Authors (Fan, K.)

Paper	Title	Page
WEPLS12	A Semi-Analytical Approach to Six-Dimensional Path-Dependent Transport Matrices With Application to High-Brightness Charged-Particle Beam Transport	792
	C.-Y. Tsai HUST, Wuhan, People’s Republic of China K. Fan Huazhong University of Science and Technology, State Key Laboratory of Advanced Electromagnetic Engineering and Technology,, Hubei, People’s Republic of China
	Funding: This work was supported by the Fundamental Research Funds for the Central Universities under Project No. 5003131049. Efficient and accurate estimate of high-brightness electron beam dynamics is an important step to the overall performance evaluation in modern particle accelerators. Utilizing the moment description to study multi-particle beam dynamics, it is necessary to develop a path-dependent transport matrix, together with application of the drift-kick algorithm. In this paper we will construct semi-analytical models for three typical beam transport elements, solenoid with fringe fields, transverse deflecting cavity, and a beam slit. To construct the semi-analytical models for these elements, we begin by formulating the simplified single-particle equations of motion, and apply typical numerical techniques to solve the corresponding six-by-six transport matrix as a function of the path coordinate. The developed semi-analytical models are demonstrated with three practical examples, where our numerical results are discussed, compared with and validated by particle tracking simulations. These path-dependent transport matrix models can be incorporated to the analysis based on beam matrix method for the application to high-brightness charged-particle beam transport. C.-Y. Tsai et al., Nuclear Inst. And Methods in Physics Research, A 937 (2019) 1-20
	Poster WEPLS12 [3.099 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-NAPAC2019-WEPLS12
About •	paper received ※ 20 August 2019 paper accepted ※ 03 September 2019 issue date ※ 08 October 2019
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MOPLS08	Error Tolerance Characterization for the HUST MeV Ultrafast Electron Diffraction System	166
	Y. Song, K. Fan, C.-Y. Tsai HUST, Wuhan, People’s Republic of China
	Ultrafast electron diffraction (UED) is a powerful tool for probing atomic dynamics with a femtosecond resolution. Such a spatiotemporal resolution requires error tolerance for the UED system which includes the RF system, the laser system, the beamline elements, etc. To characterize the error tolerance of the required spatiotemporal resolution for the 1.4-cell MeV UED we are developing, we use ASTRA to simulate the UED model with errors including initial transverse beam centroid offset, RF amplitude jitter and injection phase jitter, etc. By performing simulations with different errors omitted, we can characterize the contribution of each error and thus set the tolerance for each error to obtain the required performance of UED experiment. In the end, we present the error tolerance for 10% emittance growth and 100 fs time of flight variation to maintain the required spatiotemporal resolution.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-NAPAC2019-MOPLS08
About •	paper received ※ 25 August 2019 paper accepted ※ 31 August 2019 issue date ※ 08 October 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

A Semi-Analytical Approach to Six-Dimensional Path-Dependent Transport Matrices With Application to High-Brightness Charged-Particle Beam Transport

792

C.-Y. Tsai
HUST, Wuhan, People’s Republic of China
K. Fan
Huazhong University of Science and Technology, State Key Laboratory of Advanced Electromagnetic Engineering and Technology,, Hubei, People’s Republic of China

Funding: This work was supported by the Fundamental Research Funds for the Central Universities under Project No. 5003131049.
Efficient and accurate estimate of high-brightness electron beam dynamics is an important step to the overall performance evaluation in modern particle accelerators. Utilizing the moment description to study multi-particle beam dynamics, it is necessary to develop a path-dependent transport matrix, together with application of the drift-kick algorithm*. In this paper we will construct semi-analytical models for three typical beam transport elements, solenoid with fringe fields, transverse deflecting cavity, and a beam slit. To construct the semi-analytical models for these elements, we begin by formulating the simplified single-particle equations of motion, and apply typical numerical techniques to solve the corresponding six-by-six transport matrix as a function of the path coordinate. The developed semi-analytical models are demonstrated with three practical examples, where our numerical results are discussed, compared with and validated by particle tracking simulations. These path-dependent transport matrix models can be incorporated to the analysis based on beam matrix method for the application to high-brightness charged-particle beam transport.
* C.-Y. Tsai et al., Nuclear Inst. And Methods in Physics Research, A 937 (2019) 1-20

Poster WEPLS12 [3.099 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-NAPAC2019-WEPLS12

About •

paper received ※ 20 August 2019 paper accepted ※ 03 September 2019 issue date ※ 08 October 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

MOPLS08

Error Tolerance Characterization for the HUST MeV Ultrafast Electron Diffraction System

166

Y. Song, K. Fan, C.-Y. Tsai
HUST, Wuhan, People’s Republic of China

Ultrafast electron diffraction (UED) is a powerful tool for probing atomic dynamics with a femtosecond resolution. Such a spatiotemporal resolution requires error tolerance for the UED system which includes the RF system, the laser system, the beamline elements, etc. To characterize the error tolerance of the required spatiotemporal resolution for the 1.4-cell MeV UED we are developing, we use ASTRA to simulate the UED model with errors including initial transverse beam centroid offset, RF amplitude jitter and injection phase jitter, etc. By performing simulations with different errors omitted, we can characterize the contribution of each error and thus set the tolerance for each error to obtain the required performance of UED experiment. In the end, we present the error tolerance for 10% emittance growth and 100 fs time of flight variation to maintain the required spatiotemporal resolution.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-NAPAC2019-MOPLS08

About •

paper received ※ 25 August 2019 paper accepted ※ 31 August 2019 issue date ※ 08 October 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)