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RIS citation export for MOPLS08: Error Tolerance Characterization for the HUST MeV Ultrafast Electron Diffraction System

TY  - CONF
AU  - Song, Y.
AU  - Fan, K.
AU  - Tsai, C.-Y.
ED  - Yamazaki, Yoshishige
ED  - Raubenheimer, Tor
ED  - McCausey, Amy
ED  - Schaa, Volker RW
TI  - Error Tolerance Characterization for the HUST MeV Ultrafast Electron Diffraction System
J2  - Proc. of NAPAC2019, Lansing, MI, USA, 01-06 September 2019
CY  - Lansing, MI, USA
T2  - North American Particle Accelerator Conference
T3  - 4
LA  - english
AB  - Ultrafast electron diffraction (UED) is a powerful tool for probing atomic dynamics with a femtosecond resolution. Such a spatiotemporal resolution requires error tolerance for the UED system which includes the RF system, the laser system, the beamline elements, etc. To characterize the error tolerance of the required spatiotemporal resolution for the 1.4-cell MeV UED we are developing, we use ASTRA to simulate the UED model with errors including initial transverse beam centroid offset, RF amplitude jitter and injection phase jitter, etc. By performing simulations with different errors omitted, we can characterize the contribution of each error and thus set the tolerance for each error to obtain the required performance of UED experiment. In the end, we present the error tolerance for 10% emittance growth and 100 fs time of flight variation to maintain the required spatiotemporal resolution.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 166
EP  - 169
KW  - emittance
KW  - electron
KW  - injection
KW  - laser
KW  - simulation
DA  - 2019/10
PY  - 2019
SN  - 2673-7000
SN  - 978-3-95450-223-3
DO  - doi:10.18429/JACoW-NAPAC2019-MOPLS08
UR  - http://jacow.org/napac2019/papers/mopls08.pdf
ER  -