IBIC2019 - List of Authors (Ischebeck, R.)

Paper	Title	Page
MOPP046	Electron Beam Diagnostics for SLS2.0
	C. Ozkan Loch, R. Ischebeck, G.L. Orlandi, V. Schlott, A. Streun PSI, Villigen PSI, Switzerland
	In the near future the SLS storage ring will be upgraded for significantly higher brightness and coherence. Although the upgrade will require similar instrumentation to that already implemented for current SLS operation, significant changes in the number of devices, their specifications and their technical realizations will have to be made according to the specific requirements of SLS 2.0, using the newly available technologies and standardizations at PSI. This poster will provide an overview of the design, technical specifications, implementation and expected challenges of these systems. The beam position monitors and fast-orbit feedbacks are not included in this presentation.
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TUBO01	Screens for High Precision Measurements	242
	B. Walasek-Höhne, P. Forck GSI, Darmstadt, Germany K. Hoehne FAIR, Darmstadt, Germany R. Ischebeck PSI, Villigen PSI, Switzerland G. Kube DESY, Hamburg, Germany
	Funding: This project has received funding from the European Union¿s Horizon 2020 programme under Grant Agreement No 730871. Scintillation screens made of various inorganic materials are widely used for transverse beam profile diagnostics at all kinds of accelerators. The monitor principle is based on the particles¿ energy loss and its conversion to visible light. The resulting light spot is a direct image of the two-dimensional beam distribution. For large beam sizes standard optical techniques can be applied, while for small beam sizes dedicated optical arrangements have to be used to prevent for image deformations. In the modern linac based light sources scintillator usage serves as an alternative way to overcome limitations related to coherent OTR emission. Radiation damages and intensity based saturation effects, in dependence of the screen material, have to be modelled. In this talk, an introduction to the scintillation mechanism in inorganic materials will be given including practical demands and limitations. An overview on actual applications at hadron and electron accelerators will be discussed as summary of the Joint ARIES-ADA Workshop on ¿Scintillation Screens and Optical Technology for transverse Profile Measurements¿ held in Kraków, Poland.
	Slides TUBO01 [27.172 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-TUBO01
About •	paper received ※ 09 September 2019 paper accepted ※ 16 November 2019 issue date ※ 10 November 2019
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TUBO02	FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.	249
	G.L. Orlandi, S. Borrelli, Ch. David, E. Ferrari, V. Guzenko, B. Hermann, O. Huerzeler, R. Ischebeck, C. Lombosi, C. Ozkan Loch, E. Prat PSI, Villigen PSI, Switzerland N. Cefarin, S. Dal Zilio, M. Lazzarino IOM-CNR, Trieste, Italy M. Ferianis, G. Penco, M. Veronese Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Italy
	Wire-scanners with micrometer resolution are in operation at SwissFEL and FERMI for measurements of the beam emittance and for beam profile monitoring (,). In addition, both laboratories are developing and testing innovative nano-fabricated wire-scanners capable of providing sub-micrometer resolution and being quasi non-destructive to the beam. Nano-fabricated wire-scanners with a free-standing design () and a sub-micrometer resolution (*) has been already successfully tested. In the present work, innovative nano-fabricated wire-scanners joining both features of a free-standing design and sub-micrometer resolution are presented. Experimental tests carried out at SwissFEL demonstrated the capability of such innovative wire-scanner solutions to resolve transverse profiles of the electron beams with a size of 400-500 nm without incurring in any resolution limit constraint and with a minimal beam perturbation. An overview on current status and results along with future developments of these nano-fabricated wire-scanners are here presented. ()G.L.Orlandi et al. PRAB 19, 092802 (2016). ()M.Veronese et al.this Conference. ()M.Veronese et al.NIM-A 891, 32-36, (2018) (***)S.Borrelli et al. Comm. Phys.-Nature, 1, 52 (2018).
	Slides TUBO02 [10.551 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-TUBO02
About •	paper received ※ 04 September 2019 paper accepted ※ 07 September 2019 issue date ※ 10 November 2019
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WEPP009	Measurement of Electron Pulse Length at 35 MeV Using a Terahertz Split Ring Resonator
	X.Y. Liu USTC/NSRL, Hefei, Anhui, People’s Republic of China M.M. Dehler, V. Guzenko, R. Ischebeck, X.Y. Liu, C. Lombosi, V. Schlott PSI, Villigen PSI, Switzerland T. Feurer, M. Hayati, Z. Ollmann Universität Bern, Institute of Applied Physics, Bern, Switzerland V. Georgiadis, D.M. Graham, M.T. Hibberd The University of Manchester, The Photon Science Institute, Manchester, United Kingdom A.L. Healy, S.P. Jamison Cockcroft Institute, Lancaster University, Lancaster, United Kingdom D. Lake The University of Manchester, Manchester, United Kingdom T.H. Pacey STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom D. Rohrbach University of Bern, Bern, Switzerland
	Funding: This work was supported by the European Union’s Horizon 2020 Research and Innovation Programme (730871). X.Y. Liu was supported by China Scholarship Council for a 2-year study at PSI (201706340057). The resolution of a streak camera system strongly depends on the slew rate of the deflecting element, which is the product of the amplitude and frequency of the device. An attractive approach towards femtosecond and sub-femtosecond range consists in using terahertz-driven devices, which offer a good combination of high frequency and high gradient-gradients of GV/m have been demonstrated in split ring resonator using pulse created by rectifying ultrashort laser pulses. We present results obtained from a beam experiment at the VELA facility at Daresbury laboratory. We tested a planar resonator derived from the geometry of a split ring resonator with an aperture for the beam of 20 um. Email address: xiaoyu.liu@psi.ch
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WEPP026	Electron Bunch Compression Monitors for Short Bunches - Commissioning Results from SwissFEL	578
	F. Frei, R. Ischebeck PSI, Villigen PSI, Switzerland
	In SwissFEL, by using three magnetic chicanes, 3ps long electron bunches can by compressed by a factor of more than 100 down to a few fs in order to generate ultra short X-ray pulses. In order to meet the envisaged beam performance, noninvasive longitudinal diagnostic after each compression stage is essential. These bunch compression monitors measure relative bunch length changes on a shot-to-shot basis by detecting coherent edge, synchrotron or diffraction radiation emitted by the electron bunches. While after the first two magnetic chicanes, a wide spectral part is integrated on a single broadband detector, an infrared spectrometer installed after the third magnetic chicane is providing more detailed information. Here, we will mainly report on commissioning results of the third bunch compression monitor for electron bunches of a few fs.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-WEPP026
About •	paper received ※ 03 September 2019 paper accepted ※ 10 September 2019 issue date ※ 10 November 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

MOPP046

Electron Beam Diagnostics for SLS2.0

C. Ozkan Loch, R. Ischebeck, G.L. Orlandi, V. Schlott, A. Streun
PSI, Villigen PSI, Switzerland

In the near future the SLS storage ring will be upgraded for significantly higher brightness and coherence. Although the upgrade will require similar instrumentation to that already implemented for current SLS operation, significant changes in the number of devices, their specifications and their technical realizations will have to be made according to the specific requirements of SLS 2.0, using the newly available technologies and standardizations at PSI. This poster will provide an overview of the design, technical specifications, implementation and expected challenges of these systems. The beam position monitors and fast-orbit feedbacks are not included in this presentation.

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

TUBO01

Screens for High Precision Measurements

242

B. Walasek-Höhne, P. Forck
GSI, Darmstadt, Germany
K. Hoehne
FAIR, Darmstadt, Germany
R. Ischebeck
PSI, Villigen PSI, Switzerland
G. Kube
DESY, Hamburg, Germany

Funding: This project has received funding from the European Union¿s Horizon 2020 programme under Grant Agreement No 730871.
Scintillation screens made of various inorganic materials are widely used for transverse beam profile diagnostics at all kinds of accelerators. The monitor principle is based on the particles¿ energy loss and its conversion to visible light. The resulting light spot is a direct image of the two-dimensional beam distribution. For large beam sizes standard optical techniques can be applied, while for small beam sizes dedicated optical arrangements have to be used to prevent for image deformations. In the modern linac based light sources scintillator usage serves as an alternative way to overcome limitations related to coherent OTR emission. Radiation damages and intensity based saturation effects, in dependence of the screen material, have to be modelled. In this talk, an introduction to the scintillation mechanism in inorganic materials will be given including practical demands and limitations. An overview on actual applications at hadron and electron accelerators will be discussed as summary of the Joint ARIES-ADA Workshop on ¿Scintillation Screens and Optical Technology for transverse Profile Measurements¿ held in Kraków, Poland.

Slides TUBO01 [27.172 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-TUBO01

About •

paper received ※ 09 September 2019 paper accepted ※ 16 November 2019 issue date ※ 10 November 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

TUBO02

FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.

249

G.L. Orlandi, S. Borrelli, Ch. David, E. Ferrari, V. Guzenko, B. Hermann, O. Huerzeler, R. Ischebeck, C. Lombosi, C. Ozkan Loch, E. Prat
PSI, Villigen PSI, Switzerland
N. Cefarin, S. Dal Zilio, M. Lazzarino
IOM-CNR, Trieste, Italy
M. Ferianis, G. Penco, M. Veronese
Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Italy

Wire-scanners with micrometer resolution are in operation at SwissFEL and FERMI for measurements of the beam emittance and for beam profile monitoring (*,**). In addition, both laboratories are developing and testing innovative nano-fabricated wire-scanners capable of providing sub-micrometer resolution and being quasi non-destructive to the beam. Nano-fabricated wire-scanners with a free-standing design (***) and a sub-micrometer resolution (****) has been already successfully tested. In the present work, innovative nano-fabricated wire-scanners joining both features of a free-standing design and sub-micrometer resolution are presented. Experimental tests carried out at SwissFEL demonstrated the capability of such innovative wire-scanner solutions to resolve transverse profiles of the electron beams with a size of 400-500 nm without incurring in any resolution limit constraint and with a minimal beam perturbation. An overview on current status and results along with future developments of these nano-fabricated wire-scanners are here presented.
(*)G.L.Orlandi et al. PRAB 19, 092802 (2016).
(**)M.Veronese et al.this Conference.
(***)M.Veronese et al.NIM-A 891, 32-36, (2018)
(****)S.Borrelli et al. Comm. Phys.-Nature, 1, 52 (2018).

Slides TUBO02 [10.551 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-TUBO02

About •

paper received ※ 04 September 2019 paper accepted ※ 07 September 2019 issue date ※ 10 November 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEPP009

Measurement of Electron Pulse Length at 35 MeV Using a Terahertz Split Ring Resonator

X.Y. Liu
USTC/NSRL, Hefei, Anhui, People’s Republic of China
M.M. Dehler, V. Guzenko, R. Ischebeck, X.Y. Liu, C. Lombosi, V. Schlott
PSI, Villigen PSI, Switzerland
T. Feurer, M. Hayati, Z. Ollmann
Universität Bern, Institute of Applied Physics, Bern, Switzerland
V. Georgiadis, D.M. Graham, M.T. Hibberd
The University of Manchester, The Photon Science Institute, Manchester, United Kingdom
A.L. Healy, S.P. Jamison
Cockcroft Institute, Lancaster University, Lancaster, United Kingdom
D. Lake
The University of Manchester, Manchester, United Kingdom
T.H. Pacey
STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
D. Rohrbach
University of Bern, Bern, Switzerland

Funding: This work was supported by the European Union’s Horizon 2020 Research and Innovation Programme (730871). X.Y. Liu was supported by China Scholarship Council for a 2-year study at PSI (201706340057).
The resolution of a streak camera system strongly depends on the slew rate of the deflecting element, which is the product of the amplitude and frequency of the device. An attractive approach towards femtosecond and sub-femtosecond range consists in using terahertz-driven devices, which offer a good combination of high frequency and high gradient-gradients of GV/m have been demonstrated in split ring resonator using pulse created by rectifying ultrashort laser pulses. We present results obtained from a beam experiment at the VELA facility at Daresbury laboratory. We tested a planar resonator derived from the geometry of a split ring resonator with an aperture for the beam of 20 um.
Email address: xiaoyu.liu@psi.ch

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reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEPP026

Electron Bunch Compression Monitors for Short Bunches - Commissioning Results from SwissFEL

578

F. Frei, R. Ischebeck
PSI, Villigen PSI, Switzerland

In SwissFEL, by using three magnetic chicanes, 3ps long electron bunches can by compressed by a factor of more than 100 down to a few fs in order to generate ultra short X-ray pulses. In order to meet the envisaged beam performance, noninvasive longitudinal diagnostic after each compression stage is essential. These bunch compression monitors measure relative bunch length changes on a shot-to-shot basis by detecting coherent edge, synchrotron or diffraction radiation emitted by the electron bunches. While after the first two magnetic chicanes, a wide spectral part is integrated on a single broadband detector, an infrared spectrometer installed after the third magnetic chicane is providing more detailed information. Here, we will mainly report on commissioning results of the third bunch compression monitor for electron bunches of a few fs.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-WEPP026

About •

paper received ※ 03 September 2019 paper accepted ※ 10 September 2019 issue date ※ 10 November 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)