FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.

Orlandi, Gian Luca; Borrelli, Simona; Cefarin, Nicola; Dal Zilio, Simone; David, Christian; Ferianis, Mario; Ferrari, Eugenio; Guzenko, Vitaliy; Hermann, Benedikt; Huerzeler, Orell; Ischebeck, Rasmus; Lazzarino, Marco; Lombosi, Csaba; Ozkan Loch, Cigdem; Penco, Giuseppe; Prat, Eduard; Veronese, Marco

doi:10.18429/JACoW-IBIC2019-TUBO02

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Text/Word citation export for TUBO02: FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.

G.L. Orlandi et al., “FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.”, in Proc. IBIC'19, Malmö, Sweden, Sep. 2019, pp. 249-252. doi:10.18429/JACoW-IBIC2019-TUBO02