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TY - CONF AU - Walasek-Höhne, B. AU - Forck, P. AU - Hoehne, K. AU - Ischebeck, R. AU - Kube, G. ED - Schaa, Volker RW ED - Jansson, Andreas ED - Shea, Thomas ED - Olander, Johan TI - Screens for High Precision Measurements J2 - Proc. of IBIC2019, Malmö, Sweden, 08-12 September 2019 CY - Malmö, Sweden T2 - International Beam Instrumentation Conferenc T3 - 8 LA - english AB - Scintillation screens made of various inorganic materials are widely used for transverse beam profile diagnostics at all kinds of accelerators. The monitor principle is based on the particles¿ energy loss and its conversion to visible light. The resulting light spot is a direct image of the two-dimensional beam distribution. For large beam sizes standard optical techniques can be applied, while for small beam sizes dedicated optical arrangements have to be used to prevent for image deformations. In the modern linac based light sources scintillator usage serves as an alternative way to overcome limitations related to coherent OTR emission. Radiation damages and intensity based saturation effects, in dependence of the screen material, have to be modelled. In this talk, an introduction to the scintillation mechanism in inorganic materials will be given including practical demands and limitations. An overview on actual applications at hadron and electron accelerators will be discussed as summary of the Joint ARIES-ADA Workshop on ¿Scintillation Screens and Optical Technology for transverse Profile Measurements¿ held in Kraków, Poland. PB - JACoW Publishing CP - Geneva, Switzerland SP - 242 EP - 248 KW - electron KW - radiation KW - diagnostics KW - beam-diagnostic KW - detector DA - 2019/11 PY - 2019 SN - 2673-5350 SN - 978-3-95450-204-2 DO - doi:10.18429/JACoW-IBIC2019-TUBO01 UR - http://jacow.org/ibic2019/papers/tubo01.pdf ER -