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TY - CONF AU - Orlandi, G.L. AU - Borrelli, S. AU - Cefarin, N. AU - Dal Zilio, S. AU - David, Ch. AU - Ferianis, M. AU - Ferrari, E. AU - Guzenko, V. AU - Hermann, B. AU - Huerzeler, O. AU - Ischebeck, R. AU - Lazzarino, M. AU - Lombosi, C. AU - Ozkan Loch, C. AU - Penco, G. AU - Prat, E. AU - Veronese, M. ED - Schaa, Volker RW ED - Jansson, Andreas ED - Shea, Thomas ED - Olander, Johan TI - FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements. J2 - Proc. of IBIC2019, Malmö, Sweden, 08-12 September 2019 CY - Malmö, Sweden T2 - International Beam Instrumentation Conferenc T3 - 8 LA - english AB - Wire-scanners with micrometer resolution are in operation at SwissFEL and FERMI for measurements of the beam emittance and for beam profile monitoring (*,**). In addition, both laboratories are developing and testing innovative nano-fabricated wire-scanners capable of providing sub-micrometer resolution and being quasi non-destructive to the beam. Nano-fabricated wire-scanners with a free-standing design (***) and a sub-micrometer resolution (****) has been already successfully tested. In the present work, innovative nano-fabricated wire-scanners joining both features of a free-standing design and sub-micrometer resolution are presented. Experimental tests carried out at SwissFEL demonstrated the capability of such innovative wire-scanner solutions to resolve transverse profiles of the electron beams with a size of 400-500 nm without incurring in any resolution limit constraint and with a minimal beam perturbation. An overview on current status and results along with future developments of these nano-fabricated wire-scanners are here presented. PB - JACoW Publishing CP - Geneva, Switzerland SP - 249 EP - 252 KW - FEL KW - electron KW - experiment KW - operation KW - emittance DA - 2019/11 PY - 2019 SN - 2673-5350 SN - 978-3-95450-204-2 DO - doi:10.18429/JACoW-IBIC2019-TUBO02 UR - http://jacow.org/ibic2019/papers/tubo02.pdf ER -