FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.

Orlandi, Gian Luca; Borrelli, Simona; Cefarin, Nicola; Dal Zilio, Simone; David, Christian; Ferianis, Mario; Ferrari, Eugenio; Guzenko, Vitaliy; Hermann, Benedikt; Huerzeler, Orell; Ischebeck, Rasmus; Lazzarino, Marco; Lombosi, Csaba; Ozkan Loch, Cigdem; Penco, Giuseppe; Prat, Eduard; Veronese, Marco

doi:10.18429/JACoW-IBIC2019-TUBO02

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RIS citation export for TUBO02: FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.

TY  - CONF
AU  - Orlandi, G.L.
AU  - Borrelli, S.
AU  - Cefarin, N.
AU  - Dal Zilio, S.
AU  - David, Ch.
AU  - Ferianis, M.
AU  - Ferrari, E.
AU  - Guzenko, V.
AU  - Hermann, B.
AU  - Huerzeler, O.
AU  - Ischebeck, R.
AU  - Lazzarino, M.
AU  - Lombosi, C.
AU  - Ozkan Loch, C.
AU  - Penco, G.
AU  - Prat, E.
AU  - Veronese, M.
ED  - Schaa, Volker RW
ED  - Jansson, Andreas
ED  - Shea, Thomas
ED  - Olander, Johan
TI  - FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.
J2  - Proc. of IBIC2019, Malmö, Sweden, 08-12 September 2019
CY  - Malmö, Sweden
T2  - International Beam Instrumentation Conferenc
T3  - 8
LA  - english
AB  - Wire-scanners with micrometer resolution are in operation at SwissFEL and FERMI for measurements of the beam emittance and for beam profile monitoring (*,**). In addition, both laboratories are developing and testing innovative nano-fabricated wire-scanners capable of providing sub-micrometer resolution and being quasi non-destructive to the beam. Nano-fabricated wire-scanners with a free-standing design (***) and a sub-micrometer resolution (****) has been already successfully tested. In the present work, innovative nano-fabricated wire-scanners joining both features of a free-standing design and sub-micrometer resolution are presented. Experimental tests carried out at SwissFEL demonstrated the capability of such innovative wire-scanner solutions to resolve transverse profiles of the electron beams with a size of 400-500 nm without incurring in any resolution limit constraint and with a minimal beam perturbation. An overview on current status and results along with future developments of these nano-fabricated wire-scanners are here presented.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 249
EP  - 252
KW  - FEL
KW  - electron
KW  - experiment
KW  - operation
KW  - emittance
DA  - 2019/11
PY  - 2019
SN  - 2673-5350
SN  - 978-3-95450-204-2
DO  - doi:10.18429/JACoW-IBIC2019-TUBO02
UR  - http://jacow.org/ibic2019/papers/tubo02.pdf
ER  -