SRF2019 - List of Authors (Sun, Z.)

Paper	Title	Page
MOP010	Ab Initio Calculations on the Growth and Superconducting Properties of Nb₃Sn	39
SUSP023	use link to see paper's listing under its alternate paper code
	N. Sitaraman, T. Arias, P. Cueva, M.M. Kelley, D.A. Muller Cornell University, Ithaca, New York, USA J.M. Carlson, A.R. Pack, M.K. Transtrum Brigham Young University, Provo, USA M. Liepe, R.D. Porter, Z. Sun Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
	Funding: This research was funded by the Center for Bright Beams. In this work, we employ theoretical ab initio techniques to solve mysteries and gain new insights in Nb₃Sn SRF physics. We determine the temperature dependence of Nb₃Sn antisite defect formation energies, and discuss the implications of these results for defect segregation. We calculate the phonon spectral function for Nb₃Sn cells with different combinations of antisite defects and use these results to determine Tc as a function of stoichiometry. These results allow for the first-ever determination of Tc in the tin-rich regime, where experimental measurements are unavailable and which is critical to understanding the impact of tin-rich grain boundaries on superconducting cavity performance. Finally, we propose a theory for the growth mechanism of Nb₃Sn growth on a thick oxide, explaining the puzzling disappearing droplet behavior of Sn on Nb oxide and suggesting how in general an oxide layer reacts with Sn to produce a uniform Nb₃Sn layer.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2019-MOP010
About •	paper received ※ 02 July 2019 paper accepted ※ 03 July 2019 issue date ※ 14 August 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

MOP014	Electroplating of Sn Film on Nb Substrate for Generating Nb₃Sn Thin Films and Post Laser Annealing	51
SUSP036	use link to see paper's listing under its alternate paper code
	Z. Sun, M. Liepe, T.E. Oseroff, R.D. Porter Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA T. Arias, A.B. Connolly, J.M. Scholtz, N. Sitaraman, M.O. Thompson Cornell University, Ithaca, USA X. Deng University of Virginia, Charlottesville, Virginia, USA K.D. Dobson University of Delaware, Newark, Delaware, USA
	Controlling film quality of Nb₃Sn is critical to its SRF cavity performance. The state-of-the-art vapor diffusion approach for Nb₃Sn deposition observed surface roughness, thin grain regions, and misfit dislocations which negatively affect the RF performance. The Sn deficiency and non-uniformity at the nucleation stage of vapor deposition is believed to be the fundamental reason to cause these roughness and defects issues. Thus, we propose to pre-deposit a uniform Sn film on the Nb substrate, which is able to provide sufficient Sn source during the following heat treatment for Nb₃Sn nucleation and growth. Here, we demonstrated successful electrodeposition of a low-roughness, dendrite-free, excellent-adhesion Sn film on the Nb substrate. More importantly, we further achieved a uniform, low-roughness (Ra = 66 nm), pure-stoichiometric Nb₃Sn film through thermal treatment of this electroplated Sn film in the furnace. Additionally, we provide preliminary results of laser annealing as a post treatment for epitaxial grain growth and roughness reduction.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2019-MOP014
About •	paper received ※ 22 June 2019 paper accepted ※ 30 June 2019 issue date ※ 14 August 2019
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TUFUB8	CVD Coated Copper Substrate SRF Cavity Research at Cornell University	381
	M. Ge, T. Gruber, J.J. Kaufman, M. Liepe, J.T. Maniscalco, T.E. Oseroff, R.D. Porter, Z. Sun Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA V.M. Arrieta, S.R. McNeal Ultramet, Pacoima, California, USA
	Chemical vapor deposition (CVD) is a promising alternative to conventional sputter techniques for coating copper substrate cavities with high-quality superconducting films. Through multiple SRF-related DOE SBIR projects, Ultramet has developed CVD processes and CVD reactor designs for SRF cavities, and Cornell University has conducted extensive RF testing of CVD coated surfaces. Here we report results from thin-film CVD Nb₃Sn coated copper test plates, and for thick-film CVD niobium on copper including full-scale single cell 1.3 GHz copper substrate cavities. Detailed optical inspection and surface characterization show high-quality and well-adhered coatings. No copper contamination is found. The Nb₃Sn coated plates have a uniform Nb₃Sn coating with a slightly low tin concentration (19 -22%), but a BCS resistance well in agreement with predictions. The CVD Nb coatings on copper plates demonstrate excellent adhesion characteristics and exceeded surface fields of 50 mT without showing signs of a strong Q-slope that is frequently observed in sputtered Nb cavities. Multiple single-cell 1.3 GHz copper cavities have been coated to date at Ultramet, and results from RF testing of these are presented and discussed.
	Slides TUFUB8 [12.488 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2019-TUFUB8
About •	paper received ※ 01 July 2019 paper accepted ※ 05 July 2019 issue date ※ 14 August 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

THP044	RF Characterization of Novel Superconducting Materials and Multilayers	950
SUSP021	use link to see paper's listing under its alternate paper code
	T.E. Oseroff, M. Liepe, Z. Sun Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA B. Moeckly STI, Santa Barbara, California, USA M.J. Sowa Veeco-CNT, Medford, USA
	Cutting edge SRF technology is likely approaching the fundamental limitations of niobium cavities operating in the Meissner state. This combined with the obvious advantages of using higher critical temperature superconductors and thin film depositions leads to interest in the RF characterization of such materials. A TE mode niobium sample host cavity was used to characterize the RF performance of 5" (12.7 cm) diameter sample plates as a function of field and temperature at 4 GHz. Materials studied include MgB₂ and thin film atomic layer deposition (ALD) NbN and NbTiN on Nb substrates. These higher critical temperature superconductors all having coherence lengths on the order of a few nm. It is therefore likely that defects on the order of the coherence lengths will cause early flux penetration well before the theorized superheating field of an ideal superconducting surface. Superconductor-insulator-superconductor (SIS) multilayers have been proposed as a mechanism of arresting these early penetration flux avalanches and are therefore studied here as well, using the same NbN and NbTiN films, but over thin layers of insulating AlN on Nb substrates.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2019-THP044
About •	paper received ※ 02 July 2019 paper accepted ※ 03 July 2019 issue date ※ 14 August 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

MOP010

Ab Initio Calculations on the Growth and Superconducting Properties of Nb₃Sn

39

SUSP023

use link to see paper's listing under its alternate paper code

N. Sitaraman, T. Arias, P. Cueva, M.M. Kelley, D.A. Muller
Cornell University, Ithaca, New York, USA
J.M. Carlson, A.R. Pack, M.K. Transtrum
Brigham Young University, Provo, USA
M. Liepe, R.D. Porter, Z. Sun
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA

Funding: This research was funded by the Center for Bright Beams.
In this work, we employ theoretical ab initio techniques to solve mysteries and gain new insights in Nb₃Sn SRF physics. We determine the temperature dependence of Nb₃Sn antisite defect formation energies, and discuss the implications of these results for defect segregation. We calculate the phonon spectral function for Nb₃Sn cells with different combinations of antisite defects and use these results to determine Tc as a function of stoichiometry. These results allow for the first-ever determination of Tc in the tin-rich regime, where experimental measurements are unavailable and which is critical to understanding the impact of tin-rich grain boundaries on superconducting cavity performance. Finally, we propose a theory for the growth mechanism of Nb₃Sn growth on a thick oxide, explaining the puzzling disappearing droplet behavior of Sn on Nb oxide and suggesting how in general an oxide layer reacts with Sn to produce a uniform Nb₃Sn layer.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2019-MOP010

About •

paper received ※ 02 July 2019 paper accepted ※ 03 July 2019 issue date ※ 14 August 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

MOP014

Electroplating of Sn Film on Nb Substrate for Generating Nb₃Sn Thin Films and Post Laser Annealing

51

SUSP036

use link to see paper's listing under its alternate paper code

Z. Sun, M. Liepe, T.E. Oseroff, R.D. Porter
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
T. Arias, A.B. Connolly, J.M. Scholtz, N. Sitaraman, M.O. Thompson
Cornell University, Ithaca, USA
X. Deng
University of Virginia, Charlottesville, Virginia, USA
K.D. Dobson
University of Delaware, Newark, Delaware, USA

Controlling film quality of Nb₃Sn is critical to its SRF cavity performance. The state-of-the-art vapor diffusion approach for Nb₃Sn deposition observed surface roughness, thin grain regions, and misfit dislocations which negatively affect the RF performance. The Sn deficiency and non-uniformity at the nucleation stage of vapor deposition is believed to be the fundamental reason to cause these roughness and defects issues. Thus, we propose to pre-deposit a uniform Sn film on the Nb substrate, which is able to provide sufficient Sn source during the following heat treatment for Nb₃Sn nucleation and growth. Here, we demonstrated successful electrodeposition of a low-roughness, dendrite-free, excellent-adhesion Sn film on the Nb substrate. More importantly, we further achieved a uniform, low-roughness (Ra = 66 nm), pure-stoichiometric Nb₃Sn film through thermal treatment of this electroplated Sn film in the furnace. Additionally, we provide preliminary results of laser annealing as a post treatment for epitaxial grain growth and roughness reduction.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2019-MOP014

About •

paper received ※ 22 June 2019 paper accepted ※ 30 June 2019 issue date ※ 14 August 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

TUFUB8

CVD Coated Copper Substrate SRF Cavity Research at Cornell University

381

M. Ge, T. Gruber, J.J. Kaufman, M. Liepe, J.T. Maniscalco, T.E. Oseroff, R.D. Porter, Z. Sun
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
V.M. Arrieta, S.R. McNeal
Ultramet, Pacoima, California, USA

Chemical vapor deposition (CVD) is a promising alternative to conventional sputter techniques for coating copper substrate cavities with high-quality superconducting films. Through multiple SRF-related DOE SBIR projects, Ultramet has developed CVD processes and CVD reactor designs for SRF cavities, and Cornell University has conducted extensive RF testing of CVD coated surfaces. Here we report results from thin-film CVD Nb₃Sn coated copper test plates, and for thick-film CVD niobium on copper including full-scale single cell 1.3 GHz copper substrate cavities. Detailed optical inspection and surface characterization show high-quality and well-adhered coatings. No copper contamination is found. The Nb₃Sn coated plates have a uniform Nb₃Sn coating with a slightly low tin concentration (19 -22%), but a BCS resistance well in agreement with predictions. The CVD Nb coatings on copper plates demonstrate excellent adhesion characteristics and exceeded surface fields of 50 mT without showing signs of a strong Q-slope that is frequently observed in sputtered Nb cavities. Multiple single-cell 1.3 GHz copper cavities have been coated to date at Ultramet, and results from RF testing of these are presented and discussed.

Slides TUFUB8 [12.488 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2019-TUFUB8

About •

paper received ※ 01 July 2019 paper accepted ※ 05 July 2019 issue date ※ 14 August 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

THP044

RF Characterization of Novel Superconducting Materials and Multilayers

950

SUSP021

use link to see paper's listing under its alternate paper code

T.E. Oseroff, M. Liepe, Z. Sun
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
B. Moeckly
STI, Santa Barbara, California, USA
M.J. Sowa
Veeco-CNT, Medford, USA

Cutting edge SRF technology is likely approaching the fundamental limitations of niobium cavities operating in the Meissner state. This combined with the obvious advantages of using higher critical temperature superconductors and thin film depositions leads to interest in the RF characterization of such materials. A TE mode niobium sample host cavity was used to characterize the RF performance of 5" (12.7 cm) diameter sample plates as a function of field and temperature at 4 GHz. Materials studied include MgB₂ and thin film atomic layer deposition (ALD) NbN and NbTiN on Nb substrates. These higher critical temperature superconductors all having coherence lengths on the order of a few nm. It is therefore likely that defects on the order of the coherence lengths will cause early flux penetration well before the theorized superheating field of an ideal superconducting surface. Superconductor-insulator-superconductor (SIS) multilayers have been proposed as a mechanism of arresting these early penetration flux avalanches and are therefore studied here as well, using the same NbN and NbTiN films, but over thin layers of insulating AlN on Nb substrates.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2019-THP044

About •

paper received ※ 02 July 2019 paper accepted ※ 03 July 2019 issue date ※ 14 August 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)