Author: Palczewski, A.D.
Paper Title Page
MOPB050 Cavity Processing and Testing Activities at Jefferson Lab for LCLS-II Production 173
 
  • L. Zhao, G.K. Davis, J. Follkie, D. Forehand, K. Macha, A.D. Palczewski, A.V. Reilly
    JLab, Newport News, Virginia, USA
 
  Funding: Work supported by Jefferson Science Associates, LLC under U.S. DOE Contracts DE-AC05-06OR23177 and DE-AC02-76SF00515 for the LCLS-II Project.
Cryomodule production for LCLS-II is well underway at Jefferson Lab. This paper explains the process flow for production cavities, from being received at the Test Lab to being assembled onto cavity strings. Taking our facility and infrastructure into consideration, process optimization and process control are implemented to ensure high quality products.
 
poster icon Poster MOPB050 [2.338 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2017-MOPB050  
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TUXBA06
Analysis of Flux Pinning Variability with Nb Stock Material  
 
  • A.D. Palczewski
    JLab, Newport News, Virginia, USA
 
  Within Nb material batches which otherwise conform to specification, a distinct variability of susceptibility to pinning of residual magnetic field and thus enhanced RF losses and lower Q has been observed. Systematic investigation of the various lots of material procured for use in the fabrication of LCLS-II cavities is underway to distinguish the critical contributing material characteristic. The aim is clarification of a revision to the material specification in order to reliably obtain lower residual resistance in operational SRF cavities for any application.  
slides icon Slides TUXBA06 [1.530 MB]  
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TUPB066 RF Results of Nb Coated SRF Accelerator Cavities via HiPIMS 535
 
  • M.C. Burton, M. Beebe, R.A. Lukaszew
    The College of William and Mary, Williamsburg, Virginia, USA
  • A.D. Palczewski, H.L. Phillips, C.E. Reece
    JLab, Newport News, Virginia, USA
 
  Funding: Jefferson Lab
Bulk Nb SRF cavities are the preferred method for acceleration of charged particles. However, bulk Nb cavities suffer from variable RF performance, high cost and impose material & design restrictions on other components of a particle accelerator. Since SRF is a shallow surface phenomena, a proposed solution is to deposit a Nb thin film on the interior of a cavity made of an alternative material such as Cu. While this approach has been attempted in the past, new energetic condensation techniques, such as High Power Impulse Magnetron Sputtering (HiPIMS), offer the opportunity to create Nb films with improved properties compared to traditional methods. To test HiPIMS, a study was performed in which Nb films were deposited on samples in multiple 'series' where only one parameter (Ion Fraction, Condensation Energy'etc.) is varied. Sample properties were then characterized using: XRD, AFM, SEM'etc., and correlations made between deposition parameters and film properties. Nb films were then deposited on 1.3GHz Cu cavities at select parameter sets and RF tested. Here we present the results from the Nb film studies and correlate the sample properties to RF results of Nb/Cu cavities.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2017-TUPB066  
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THPB036 Fundamental SIMS Analyses for Nitrogen-enriched Niobium 821
 
  • J. Tuggle, M.J. Kelley
    Virginia Polytechnic Institute and State University, Blacksburg, USA
  • M.J. Kelley, U. Pudasaini
    The College of William and Mary, Williamsburg, Virginia, USA
  • M.J. Kelley, A.D. Palczewski, C.E. Reece
    JLab, Newport News, Virginia, USA
  • F.A. Stevie
    NCSU AIF, Raleigh, North Carolina, USA
 
  Funding: Co-Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177. W&M and VT work supported by the Office of High Energy Physics, U.S. DOE under grant DE-SC-0014475
In order to fully understand nitrogen addition techniques it is vital to have a full understanding of the material, including the content, location, and speciation of nitrogen contained in the treated Nb. In this work Secondary Ion Mass Spectrometry (SIMS) is used to elucidate content and location. Dynamic SIMS nitrogen analysis is reported, for the first time, for "as-received" cavity grade niobium from three separate suppliers. In addition, a number of method and instrumental issues are discussed including depth resolution, detection limit, and quantification.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2017-THPB036  
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