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RIS citation export for THPB036: Fundamental SIMS Analyses for Nitrogen-enriched Niobium

TY - CONF
AU - Tuggle, J.
AU - Kelley, M.J.
AU - Palczewski, A.D.
AU - Pudasaini, U.
AU - Reece, C.E.
AU - Stevie, F.A.
ED - Schaa, Volker RW
ED - He, Yuan
ED - Li, Lu
ED - Zhao, Ning
TI - Fundamental SIMS Analyses for Nitrogen-enriched Niobium
J2 - Proc. of SRF2017, Lanzhou, China, July 17-21, 2017
C1 - Lanzhou, China
T2 - International Conference on RF Superconductivity
T3 - 18
LA - english
AB - In order to fully understand nitrogen addition techniques it is vital to have a full understanding of the material, including the content, location, and speciation of nitrogen contained in the treated Nb. In this work Secondary Ion Mass Spectrometry (SIMS) is used to elucidate content and location. Dynamic SIMS nitrogen analysis is reported, for the first time, for "as-received" cavity grade niobium from three separate suppliers. In addition, a number of method and instrumental issues are discussed including depth resolution, detection limit, and quantification.
PB - JACoW
CP - Geneva, Switzerland
SP - 821
EP - 824
KW - ion
KW - niobium
KW - cavity
KW - interface
KW - instrumentation
DA - 2018/01
PY - 2018
SN - 978-3-95450-191-5
DO - 10.18429/JACoW-SRF2017-THPB036
UR - http://jacow.org/srf2017/papers/thpb036.pdf
ER -