Author: Anashin, V.S.
Paper Title Page
WECDMH02
 Testing of Electronic Components at FLNR JINR Accelerator Complex: Current Status and the 7-Year Roadmap  
 
  • S. Mitrofanov, B. Gikal, G.G. Gulbekyan, I.V. Kalagin, N.F. Osipov, S.V. Paschenko, V.A. Skuratov, Yu.G. Teterev
    JINR, Dubna, Moscow Region, Russia
  • V.S. Anashin
    United Rocket and Space Corporation, Institute of Space Device Engineering, Moscow, Russia
  
  To meet the growing requirements of the Russian Space Agency (Roscosmos) in the electronic components testing, the first dedicated beamline was created in 2011. At 2014 the full value facility, consisted of three different beamlines, was successfully commissioned and routinely used. Since then, plenty of efforts were spent for upgrade of beamlines and elaboration of new methods of high energy heavy ion beam parameters evaluation and control under the SEE testing. The current status of the facility, the last news of the ion beam control at high level of LTE and the 7-year roadmap will be presented.  
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THCAMH01 Universal Proton and Neutron Centre for Radiation Resistance of Avionic, Space Electronics and Other Applications at 1 Gev Synchrocyclotron in PNPI 105
 
  • S.A. Artamonov, D.A. Amerkanov, E.M. Ivanov, J.S. Lebedeva, G.F. Mikheev, G.A. Riabov, O.A. Shcherbakov, A.S. Vorobyev
    PNPI, Gatchina, Leningrad District, Russia
  • V.S. Anashin, L.R. Bakirov, A.E. Koziukov
    United Rocket and Space Corporation, Institute of Space Device Engineering, Moscow, Russia
  • P.A. Chubunov
    ISDE, Moscow, Russia
  
  In PNPI RNC KI a universal center for testing electronic components for the needs of aviation and space and other applications is created on the synchrocyclotron SC-1000 with the proton energy of 1 GeV. The center consists of two protons and one neutron stands for test facilities developed at the PNPI in collaboration with the ROSCOSMOS Interagency Testing Center. The PNPI center is equipped with all necessary systems of diagnostics and monitoring of a beam, installation of targets on a beam. There is an opportunity to vary temperature of exemplars in the wide range. A unique conjunction of proton beams with variable energy 60-1000 MeV and atmospheric like neutron beam with broad energy range (1-1000 MeV) spectrum enable to perform complex testing of the semiconductor electronic devices at the SC-1000 within a single testing cycle.  
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