Author: Zhou, L.
Paper Title Page
TUPYP040
 Experimental Setup Design of Hard X-ray Coherent Scattering (HXCS) Beamline at HEPS  
 
  • Z.N. Ou, R.Y. Liao, S. Tang, X. Wang, H.H. Yu, L. Zhou
    IHEP, People’s Republic of China
  
  The HXCS is a ded­i­cated co­her­ent beam­line of the High En­ergy Pho­ton Source (HEPS). The ex­per­i­men­tal setup of the end­sta­tion mainly in­cludes two de­vices: CDI/WAXS XPCS and SAXS XPCS. To achieve high sta­bil­ity re­quire­ments, the CDI/WAXS XPCS de­vice use a nano-fo­cus­ing AKB mir­rors sys­tem, which will focus hard x-rays to a focal spot as small as 100 nm with a small work­ing dis­tance of 64 mm. In the nar­row work­ing dis­tance, AKB mir­ror cham­ber and sam­ple cham­ber are de­signed as a unit but sep­a­rated from the mid­dle. And the de­vice is de­signed with two sets of switch­able sam­ple table, in order to flex­i­bly carry out four co­her­ent tech­niques. Due to high sta­bil­ity, the CDI/WAXS XPCS de­vice is strin­gent de­signed for high stiff­ness, high tem­per­a­ture sta­bil­ity and metrol­ogy. Be­sides, the other im­por­tant equip­ments of the beam­line in­clude a 1.5m WAXS tube and a 14m SAXS tube. For high-res­o­lu­tion ap­pli­ca­tions, the WAXS tube can be ro­tated around the sam­ple in the hor­i­zon­tal and ver­ti­cal plane by 45°and the SAXS tube can ad­just dis­tance and an­gu­la­tion. At pre­sent, the whole ex­per­i­men­tal setup is de­signed ac­cord­ing to the fine me­chan­i­cal de­sign which can meet the ex­per­i­men­tal re­quire­ments.  
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THPPP022
 A compact direct measurement method for relative positioning of KB mirrors nano-experimental apparatus based on grating interferometers  
 
  • S. Tang, T. He, M. Li, R.Y. Liao, Z.N. Ou, W.F. Sheng, Y. Tao, H.H. Yu, L. Zhou
    IHEP, People’s Republic of China
  • T. He
    University of Chinese Academy of Sciences, Beijing, People’s Republic of China
  • H.H. Yu
    UCAS, Beijing, People’s Republic of China
  
  Funding: This work is supported by the project of High Energy Photon Source (HEPS).
Po­si­tion­ing mea­sure­ment is re­graded as an ef­fec­tive way for the po­si­tion com­pen­sa­tion and feed­back of nano-ex­per­i­men­tal ap­pa­ra­tus. How­ever, it usu­ally suf­fers many re­stric­tions from the com­pli­cated ap­plied oc­ca­sion of a typ­i­cal per­for­mance beam­line for next-gen­er­a­tion syn­chro­tron ra­di­a­tion light source. To deal with the prob­lem, a com­pact di­rect mea­sure­ment method based on grat­ing in­ter­fer­om­e­ters is pre­sented. The prin­ci­ple, con­fig­u­ra­tion, ex­per­i­ment are de­signed and im­ple­mented for the ver­i­fi­ca­tion of the fea­si­bil­ity. It per­forms a high res­o­lu­tion in or­thog­o­nal/lat­eral di­rec­tion rel­a­tive to laser beam, which can over­come an in­fea­si­ble short­age of a typ­i­cal in­ter­fer­om­e­ter for di­rect lat­eral po­si­tion­ing. So, it is used for po­si­tion­ing mea­sure­ment & com­pen­sa­tion be­tween KB mir­rors and nano-stages of a sam­ple for the ex­per­i­ments of CDI, bragg-CDI, pytcho­graph, XPCS, etc. Com­pared with the ex­isted meth­ods, huge frame, two vac­uum cham­bers re­stric­tion, multi-axis in­ter­fer­om­e­ter and bench­mark relay are avoided for the com­pact sys­tem by using pro­posed method. 		 
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