|TUPV015||EPICS Based High-Level Control System for ESS-ERIC Emittance Measurement Unit Device||423|
For low energy linear accelerators, a typical method for measuring the transverse emittance consists in a slit and grid system. In ESS-ERIC* dedicated Emittance Measurement Units (EMUs) are used to calculate the transverse phase space (horizontal and vertical) and they are composed by a slit and grid system. This system let users reconstruct the distribution of particles in x and x’ (or y and y’), position and angle between particle trajectory and z axis, respectively. The EMU aims to measure the transverse emittance by sampling the transverse phase space. Considering control system aspect, a single EMU device is composed by different sub-systems (acquisition, motion, etc.). In this paper the software layer developed in EPICS** and realized to orchestrate the entire apparatus and control the different sub-systems will be described.
|Poster TUPV015 [1.379 MB]|
|DOI •||reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2021-TUPV015|
|About •||Received ※ 09 October 2021 Revised ※ 19 October 2021 Accepted ※ 21 December 2021 Issue date ※ 26 January 2022|
|Cite •||reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)|