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BiBTeX citation export for TUPV015: EPICS Based High-Level Control System for ESS-ERIC Emittance Measurement Unit Device

  author       = {M.G. Giacchini and C.S. Derrez and J.P.S. Martins and M. Montis and R. Tarkeshian},
  title        = {{EPICS Based High-Level Control System for ESS-ERIC Emittance Measurement Unit Device}},
  booktitle    = {Proc. ICALEPCS'21},
  pages        = {423--427},
  eid          = {TUPV015},
  language     = {english},
  keywords     = {software, controls, EPICS, emittance, hardware},
  venue        = {Shanghai, China},
  series       = {International Conference on Accelerator and Large Experimental Physics Control Systems},
  number       = {18},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {03},
  year         = {2022},
  issn         = {2226-0358},
  isbn         = {978-3-95450-221-9},
  doi          = {10.18429/JACoW-ICALEPCS2021-TUPV015},
  url          = {https://jacow.org/icalepcs2021/papers/tupv015.pdf},
  abstract     = {{For low energy linear accelerators, a typical method for measuring the transverse emittance consists in a slit and grid system. In ESS-ERIC* dedicated Emittance Measurement Units (EMUs) are used to calculate the transverse phase space (horizontal and vertical) and they are composed by a slit and grid system. This system let users reconstruct the distribution of particles in x and x’ (or y and y’), position and angle between particle trajectory and z axis, respectively. The EMU aims to measure the transverse emittance by sampling the transverse phase space. Considering control system aspect, a single EMU device is composed by different sub-systems (acquisition, motion, etc.). In this paper the software layer developed in EPICS** and realized to orchestrate the entire apparatus and control the different sub-systems will be described.}},