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RIS citation export for TUPV015: EPICS Based High-Level Control System for ESS-ERIC Emittance Measurement Unit Device

TY  - CONF
AU  - Giacchini, M.G.
AU  - Derrez, C.S.
AU  - Martins, J.P.S.
AU  - Montis, M.
AU  - Tarkeshian, R.
ED  - Furukawa, Kazuro
ED  - Yan, Yingbing
ED  - Leng, Yongbin
ED  - Chen, Zhichu
ED  - Schaa, Volker R.W.
TI  - EPICS Based High-Level Control System for ESS-ERIC Emittance Measurement Unit Device
J2  - Proc. of ICALEPCS2021, Shanghai, China, 14-22 October 2021
CY  - Shanghai, China
T2  - International Conference on Accelerator and Large Experimental Physics Control Systems
T3  - 18
LA  - english
AB  - For low energy linear accelerators, a typical method for measuring the transverse emittance consists in a slit and grid system. In ESS-ERIC* dedicated Emittance Measurement Units (EMUs) are used to calculate the transverse phase space (horizontal and vertical) and they are composed by a slit and grid system. This system let users reconstruct the distribution of particles in x and x’ (or y and y’), position and angle between particle trajectory and z axis, respectively. The EMU aims to measure the transverse emittance by sampling the transverse phase space. Considering control system aspect, a single EMU device is composed by different sub-systems (acquisition, motion, etc.). In this paper the software layer developed in EPICS** and realized to orchestrate the entire apparatus and control the different sub-systems will be described.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 423
EP  - 427
KW  - software
KW  - controls
KW  - EPICS
KW  - emittance
KW  - hardware
DA  - 2022/03
PY  - 2022
SN  - 2226-0358
SN  - 978-3-95450-221-9
DO  - doi:10.18429/JACoW-ICALEPCS2021-TUPV015
UR  - https://jacow.org/icalepcs2021/papers/tupv015.pdf
ER  -