ICALEPCS2021 - List of Authors (Derrez, C.S.)

Paper	Title	Page
TUPV015	EPICS Based High-Level Control System for ESS-ERIC Emittance Measurement Unit Device	423
	M.G. Giacchini, M. Montis INFN/LNL, Legnaro (PD), Italy C.S. Derrez, J.P.S. Martins, R. Tarkeshian ESS, Lund, Sweden
	For low energy linear accelerators, a typical method for measuring the transverse emittance consists in a slit and grid system. In ESS-ERIC* dedicated Emittance Measurement Units (EMUs) are used to calculate the transverse phase space (horizontal and vertical) and they are composed by a slit and grid system. This system let users reconstruct the distribution of particles in x and x’ (or y and y’), position and angle between particle trajectory and z axis, respectively. The EMU aims to measure the transverse emittance by sampling the transverse phase space. Considering control system aspect, a single EMU device is composed by different sub-systems (acquisition, motion, etc.). In this paper the software layer developed in EPICS** and realized to orchestrate the entire apparatus and control the different sub-systems will be described. * https://europeanspallationsource.se/ ** https://epics-controls.org/
	Poster TUPV015 [1.379 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2021-TUPV015
About •	Received ※ 09 October 2021 Revised ※ 19 October 2021 Accepted ※ 21 December 2021 Issue date ※ 26 January 2022
Cite •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

EPICS Based High-Level Control System for ESS-ERIC Emittance Measurement Unit Device

423

M.G. Giacchini, M. Montis
INFN/LNL, Legnaro (PD), Italy
C.S. Derrez, J.P.S. Martins, R. Tarkeshian
ESS, Lund, Sweden

For low energy linear accelerators, a typical method for measuring the transverse emittance consists in a slit and grid system. In ESS-ERIC* dedicated Emittance Measurement Units (EMUs) are used to calculate the transverse phase space (horizontal and vertical) and they are composed by a slit and grid system. This system let users reconstruct the distribution of particles in x and x’ (or y and y’), position and angle between particle trajectory and z axis, respectively. The EMU aims to measure the transverse emittance by sampling the transverse phase space. Considering control system aspect, a single EMU device is composed by different sub-systems (acquisition, motion, etc.). In this paper the software layer developed in EPICS** and realized to orchestrate the entire apparatus and control the different sub-systems will be described.
* https://europeanspallationsource.se/
** https://epics-controls.org/

Poster TUPV015 [1.379 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2021-TUPV015

About •

Received ※ 09 October 2021 Revised ※ 19 October 2021 Accepted ※ 21 December 2021 Issue date ※ 26 January 2022

Cite •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)