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| Paper | Title | Page | |||
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| MOOC02 | An Experimental Comparison of Single Crystal CVD Diamond and 4H-SiC Synchrotron X-Ray Beam Diagnostics | 21 | |||
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| As synchrotron beamlines increasingly use micro-focus techniques with detectors sampling at kHz rates, the need for real-time monitoring of the beam position at similar bandwidths is vital. Commercially available single-crystal CVD diamond X-ray diagnostics are well established as excellent non-destructive monitors for synchrotron X-ray beamlines. Silicon carbide (4H-SiC) X-ray beam position monitors (XBPMs) are a recent development with the potential to provide the same benefits as their diamond counterparts with larger usable apertures and lower cost. At Diamond Light Source a comparison between single-crystal CVD diamond and 4H-SiC XBPMs has been carried out. The sc-diamond and 4H-SiC beam position monitors are mounted in-line along the beam path, so that synchronous kHz measurements of the synchrotron X-ray beam motion can be measured. Several tests of the two position monitors performance are presented: comparing kHz beam position measurements from the detectors, temporal response, and signal uniformity across the face of the detectors. Each test is performed with varying bias voltages applied to the detectors. A discussion of the benefits and limitations of 4H-SiC and diamond detectors is included. | |||||
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Slides MOOC02 [2.938 MB] | ||||
| DOI • | reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2021-MOOC02 | ||||
| About • | paper received ※ 02 September 2021 paper accepted ※ 16 September 2021 issue date ※ 09 October 2021 | ||||
| Export • | reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml) | ||||