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TY - CONF AU - Houghton, C.E. AU - Bloomer, C. AU - Bobb, L. ED - Kim, Changbum ED - Schaa, Volker R. W. ED - Kim, Dong-Eon ED - Lee, Jaeyu TI - An Experimental Comparison of Single Crystal CVD Diamond and 4H-SiC Synchrotron X-Ray Beam Diagnostics J2 - Proc. of IBIC2021, Pohang, Rep. of Korea, 24-28 May 2021 CY - Pohang, Rep. of Korea T2 - International Beam Instrumentation Conference T3 - 10 LA - english AB - As synchrotron beamlines increasingly use micro-focus techniques with detectors sampling at kHz rates, the need for real-time monitoring of the beam position at similar bandwidths is vital. Commercially available single-crystal CVD diamond X-ray diagnostics are well established as excellent non-destructive monitors for synchrotron X-ray beamlines. Silicon carbide (4H-SiC) X-ray beam position monitors (XBPMs) are a recent development with the potential to provide the same benefits as their diamond counterparts with larger usable apertures and lower cost. At Diamond Light Source a comparison between single-crystal CVD diamond and 4H-SiC XBPMs has been carried out. The sc-diamond and 4H-SiC beam position monitors are mounted in-line along the beam path, so that synchronous kHz measurements of the synchrotron X-ray beam motion can be measured. Several tests of the two position monitors performance are presented: comparing kHz beam position measurements from the detectors, temporal response, and signal uniformity across the face of the detectors. Each test is performed with varying bias voltages applied to the detectors. A discussion of the benefits and limitations of 4H-SiC and diamond detectors is included. PB - JACoW Publishing CP - Geneva, Switzerland SP - 21 EP - 25 KW - detector KW - synchrotron KW - experiment KW - diagnostics KW - monitoring DA - 2021/10 PY - 2021 SN - 2673-5350 SN - 978-3-95450-230-1 DO - doi:10.18429/JACoW-IBIC2021-MOOC02 UR - https://jacow.org/ibic2021/papers/mooc02.pdf ER -