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WEPA16 |
Micro-Bunching Instability Monitor for X-ray Free Electron Laser |
radiation, electron, laser, linac |
404 |
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- C. Kim, H.-S. Kang, G. Kim, I.S. Ko
PAL, Pohang, Kyungbuk, Republic of Korea
- J.H. Ko
POSTECH, Pohang, Kyungbuk, Republic of Korea
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A direct method was developed to measure the micro-bunching instability in the X-ray Free Electron Laser (XFEL). The micro-bunching instability comes from the interaction between the electron beam and the coherent synchrotron radiation (CSR), and the FEL intensity can be affected significantly by the micro-bunching instability. However, no effective method had been introduced to monitor the micro-bunching instability, so that we installed a CCD camera to measure the micro-bunching instability after the bunch compressor. The CCD camera showed the micro-bunching instability successfully, and more interesting features of the micro-bunching instability were revealed from it.
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DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-IBIC2018-WEPA16
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About • |
paper received ※ 09 September 2018 paper accepted ※ 11 September 2018 issue date ※ 29 January 2019 |
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