IBIC2018 - List of Authors (Ko, I.S.)

Paper	Title	Page
WEOA01	Femtosecond Synchronization of PAL-XFEL
	C. Kim, H.-S. Kang, I.S. Ko, C.-K. Min PAL, Pohang, Kyungbuk, Republic of Korea
	The PAL-XFEL achieved a 20 fs jitter in the bunch arrival time at the end of undulators and its pump-probe system, which is extremely useful for maintaining a high stability of machine and time-resolved experiments with high time resolution. A low phase noise timing system and high stability high power RF system enable this low jitter. The measurement result shows 10 fs jitter of bunch arrival time at the injector and it increased ~ 20 fs due to the bunch energy variation. The possibility of improving the final jitter is described based on the optimization of bunch compressors and a longitudinal feedback.
	Slides WEOA01 [9.603 MB]
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WEPA16	Micro-Bunching Instability Monitor for X-ray Free Electron Laser	404
	C. Kim, H.-S. Kang, G. Kim, I.S. Ko PAL, Pohang, Kyungbuk, Republic of Korea J.H. Ko POSTECH, Pohang, Kyungbuk, Republic of Korea
	A direct method was developed to measure the micro-bunching instability in the X-ray Free Electron Laser (XFEL). The micro-bunching instability comes from the interaction between the electron beam and the coherent synchrotron radiation (CSR), and the FEL intensity can be affected significantly by the micro-bunching instability. However, no effective method had been introduced to monitor the micro-bunching instability, so that we installed a CCD camera to measure the micro-bunching instability after the bunch compressor. The CCD camera showed the micro-bunching instability successfully, and more interesting features of the micro-bunching instability were revealed from it.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEPA16
About •	paper received ※ 09 September 2018 paper accepted ※ 11 September 2018 issue date ※ 29 January 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

WEOA01

Femtosecond Synchronization of PAL-XFEL

C. Kim, H.-S. Kang, I.S. Ko, C.-K. Min
PAL, Pohang, Kyungbuk, Republic of Korea

The PAL-XFEL achieved a 20 fs jitter in the bunch arrival time at the end of undulators and its pump-probe system, which is extremely useful for maintaining a high stability of machine and time-resolved experiments with high time resolution. A low phase noise timing system and high stability high power RF system enable this low jitter. The measurement result shows 10 fs jitter of bunch arrival time at the injector and it increased ~ 20 fs due to the bunch energy variation. The possibility of improving the final jitter is described based on the optimization of bunch compressors and a longitudinal feedback.

Slides WEOA01 [9.603 MB]

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEPA16

Micro-Bunching Instability Monitor for X-ray Free Electron Laser

404

C. Kim, H.-S. Kang, G. Kim, I.S. Ko
PAL, Pohang, Kyungbuk, Republic of Korea
J.H. Ko
POSTECH, Pohang, Kyungbuk, Republic of Korea

A direct method was developed to measure the micro-bunching instability in the X-ray Free Electron Laser (XFEL). The micro-bunching instability comes from the interaction between the electron beam and the coherent synchrotron radiation (CSR), and the FEL intensity can be affected significantly by the micro-bunching instability. However, no effective method had been introduced to monitor the micro-bunching instability, so that we installed a CCD camera to measure the micro-bunching instability after the bunch compressor. The CCD camera showed the micro-bunching instability successfully, and more interesting features of the micro-bunching instability were revealed from it.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEPA16

About •

paper received ※ 09 September 2018 paper accepted ※ 11 September 2018 issue date ※ 29 January 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)