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WE1L4 |
Operating Liquid MetalJet X-ray Sources for Materials Research |
synchrotron, experiment, photon, optics |
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- M. Boin, D. Apel, F. García-Moreno, C. Genzel, P.H. Kamm, M. Klaus, R. Mainz, G. Wagener, R.C. Wimpory
HZB, Berlin, Germany
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Even on the 100th anniversary of the death of Wilhelm Conrad Röntgen, the demand for applications of his discovery of X-rays is not diminishing. On the contrary, both academic and industrial research and development need X-ray generating devices with ever-improving properties more than ever to meet the current challenges of science and technology. For this reason, the development of next-generation synchrotrons is being driven forward and made available to users worldwide. Nevertheless, the availability of synchrotron beamtime will always remain limited, even with the most brilliant sources for ultra-fast and high-throughput experiments. That is why the operation of and research with decentralized laboratory equipment becomes just as important. This presentation will therefore focus on the latest developments in laboratory sources in the hard X-ray regime for materials research. In this context, Helmholtz-Zentrum Berlin (HZB) has commissioned EXCILLUM’s new high-flux MetalJet X-ray devices providing photon energies up to 70 keV and 160 keV, respectively. The presentation will give a summary of the technical specifications of these sources utilizing a liquid metal as anode material and the diffractometer lab installations operated with them at HZB. Selected experimental examples are shown providing an overview of applications performed at the MetalJet measuring stations - ranging from residual stress analysis on technical parts to real-time measurements on thin films for photovoltaics applying angle- and energy-dispersive diffraction as well as studies in the field of time-resolved imaging. A comparison to synchrotron measurements is made to benchmark the performance of the available setups. In conclusion, the effort and expenses required to operate such X-ray devices for in-house research and user service measurements are summarized.
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Slides WE1L4 [3.423 MB]
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DOI • |
reference for this paper
※ doi:10.18429/JACoW-FLS2023-WE1L4
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About • |
Received ※ 23 August 2023 — Revised ※ 29 August 2023 — Accepted ※ 30 August 2023 — Issued ※ 02 December 2023 |
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TH3B2 |
Novel X-ray Beam Position Monitor for Coherent Soft X-ray Beamlines |
undulator, operation, photon, vacuum |
241 |
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- B. Podobedov, D.M. Bacescu, C. Eng, S. Hulbert, C. Mazzoli, C.S. Nelson
BNL, Upton, New York, USA
- D. Donetski, K. Kucharczyk, J. Liu, R. Lutchman, J. Zhao
Stony Brook University, Stony Brook, New York, USA
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A novel soft X-ray BPM (sXBPM) for high-power white beams of synchrotron undulator radiation is being developed through a joint effort of BNL/NSLS-II and Stony Brook University. In our approach, custom-made multi-pixel GaAs detector arrays are placed into the outer portions of the X-ray beam, and the beam position is inferred from the pixel photocurrents. Our goal is to achieve micron-scale positional and ~50 nrad angular resolution without interfering with user experiments, especially the most sensitive ones exploiting coherent properties of the beam. To this end, an elaborate mechanical system has been designed, fabricated, and installed in the 23-ID canted undulator beamline first optical enclosure, which allows positioning of the detectors with micron-scale accuracy, and provisions for possible intercepts of kW-level beam in abnormal conditions. Separately, GaAs detectors with specially tailored spectral response have been designed, fabricated, and tested in the soft and hard X-ray regions at two NSLS-II beamlines. In this talk we plan to give an overview of the sXBPM system and present the first results from the high-power white X-ray beam.
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Slides TH3B2 [5.100 MB]
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DOI • |
reference for this paper
※ doi:10.18429/JACoW-FLS2023-TH3B2
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About • |
Received ※ 15 September 2023 — Revised ※ 15 September 2023 — Accepted ※ 17 September 2023 — Issued ※ 02 December 2023 |
Cite • |
reference for this paper using
※ BibTeX,
※ LaTeX,
※ Text/Word,
※ RIS,
※ EndNote (xml)
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