Author: Vala, S.J.
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THC2 Development of Test Bench of 2.45 GHz ECR Ion Source for RFQ Accelerator 198
  • S.J. Vala, M. Abhangi, M. Bandyopadhyay, R.K. Kumar, R. Kumar
    Institute for Plasma Research, Bhat, Gandhinagar, India
  The optimization of beam quality at the entrance of RFQ system requires a test bench for the optimization of ion source and ion beam parameters. The aim of this test bench is to produce the 5 mA proton beam with rms normalized emittances lower than 0.2 for the 5 MeV RFQA. This bench consists of an indigenously developed permanent magnet based 2.45 GHz ECR ion source with three electrode ion extraction system and a LEBT to match the beam for the injection in to the RFQ. The LEBT system has been designed using TRACEWIN© code. The LEBT parameters have been optimized in order to maximize the beam transmission through the RFQ. The ECR ion source test bench has been setup and operated up to 50 kV. The plasma parameters of the ECR ion source have been measured using optical emission spectroscopy technique system. The electron temperature and electron density are typically 3.6 eV to 1.3 eV and 1-6 x 1013 cm-3 at chamber pressure in rang of 10-4 torr to 10-5 torr respectively. Deuterium ion beam of 10 mA is extracted from the test bench. This paper present the design of the test bench, results of latest extracted ion beam and plasma parameters.  
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