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TY - CONF AU - Vala, S.J. AU - Abhangi, M. AU - Bandyopadhyay, M. AU - Kumar, R. AU - Kumar, R.K. ED - Schaa, Volker RW ED - Pisciotta, Pietro TI - Development of Test Bench of 2.45 GHz ECR Ion Source for RFQ Accelerator J2 - Proc. of ECRIS2018, Catania, Italy, 10-14 September 2018 C1 - Catania, Italy T2 - International Workshop on ECR Ion Sources T3 - 23 LA - english AB - The optimization of beam quality at the entrance of RFQ system requires a test bench for the optimization of ion source and ion beam parameters. The aim of this test bench is to produce the 5 mA proton beam with rms normalized emittances lower than 0.2 pi.mm.mrad for the 5 MeV RFQA. This bench consists of an indigenously developed permanent magnet based 2.45 GHz ECR ion source with three electrode ion extraction system and a LEBT to match the beam for the injection in to the RFQ. The LEBT system has been designed using TRACEWIN© code. The LEBT parameters have been optimized in order to maximize the beam transmission through the RFQ. The ECR ion source test bench has been setup and operated up to 50 kV. The plasma parameters of the ECR ion source have been measured using optical emission spectroscopy technique system. The electron temperature and electron density are typically 3.6 eV to 1.3 eV and 1-6 x 10¹³ cm⁻³ at chamber pressure in rang of 10⁻⁴ torr to 10⁻⁵ torr respectively. Deuterium ion beam of 10 mA is extracted from the test bench. This paper present the design of the test bench, results of latest extracted ion beam and plasma parameters. PB - JACoW Publishing CP - Geneva, Switzerland SP - 198 EP - 201 KW - ECR KW - ion-source KW - plasma KW - rfq KW - LEBT DA - 2019/01 PY - 2019 SN - 978-3-95450-196-0 DO - 10.18429/JACoW-ECRIS2018-THC2 UR - http://jacow.org/ecris2018/papers/thc2.pdf ER -