Author: Fuerst, J.D.
Paper Title Page
WEPAC01 Time-Resolved Temperature Mapping System for the APS Deflecting Cavity 784
 
  • Y. Yang
    TUB, Beijing, People's Republic of China
  • P. Dhakal, J.D. Mammosser, H. Wang
    JLAB, Newport News, Virginia, USA
  • J.D. Fuerst, J.P. Holzbauer, J.A. Kaluzny, A. Nassiri, G. Wu, Y. Yang
    ANL, Argonne, USA
 
  Time-resolved temperature mapping of a superconducting cavity can give valuable information on the limiting process of the cavity performance. A fast temperature mapping system has been developed at Argonne National Laboratory (ANL) for a superconducting deflecting cavity test. The time resolution of the temperature mapping could be up to 50 us. Not only the spatial distribution of surface heating but also the thermodynamics can be recorded, which helps to understand the limitation mechanism. This new temperature mapping system has helped us to understand the rf performance limitations during the cavity vertical tests. Based on the findings from the temperature mapping, proper cavity treatment has been applied and the cavity performances have been improved.  
 
THPAC07 Thermal Modeling of the Prototype Superconducting Undulator (SCU0) 1151
 
  • Y. Shiroyanagi, C.L. Doose, J.D. Fuerst, K.C. Harkay, Q.B. Hasse, Y. Ivanyushenkov, M. Kasa
    ANL, Argonne, USA
 
  Funding: Work supported by U. S. Department of Energy, Office of Science, under Contract No. DE-AC02-06CH11357
A cryocooler-cooled superconducting undulator (SCU0) has been built and cryogenic and magnetic test has been completed. The device is currently installed in the Advanced Photon Source (APS) beam line. The device consists of a dual-core 42-pole magnet structure which is cooled to 4.2 K with a system of four cryocoolers operating in a zero-boil-off configuration. In this paper, a thermal model of the beam chamber and its cooling circuit are presented. A temperature profile of the cooling circuit and heat load to cryocoolers are calculated based on steady state temperatures. Comparison with cryogenic test results and future improvement will be discussed.