• R. Becker
  IAP, Frankfurt am Main

Based on the 'tunnel' emittance used for electron focusing, a similar procedure with two pairs of slits with variable widths is proposed to evaluate fractional emittances and brilliances for ion beams. The measurement starts with closing both slits (one after the other), until a certain fraction of the beam current is cut out. The emittance and brilliance then is well defined for the passing beam part. Formulae are given for the emittance as well as for the brilliance in dependence of the slit width and current. This emittance measurement is free from the background subtraction problem found in the classical density measurement of phase space(s). The functions for the decrease of the emittance and for the increase of the brilliance in dependence of the transmitted beam current provide a figure of merit for the quality of the investigated beam. The device at the same time is also an adjustable emittance filter for the passing beam. At the expense of current the emittance and/or brilliance of a beam can be tailored to any value, which is available by the beam quality.