IPAC2012 - List of Authors (Yan, L.X.)

Paper	Title	Page
MOPPP008	Hard X-ray Generation Experiment at Tsinghua Thomson Scattering X-Ray Source	583
	Y.-C. Du, H. Chen, Q. Du, Hua, J.F. Hua, W.-H. Huang, H.J. Qian, C.-X. Tang, H.S. Xu, L.X. Yan, Z. Zhang TUB, Beijing, People's Republic of China
	Recently, there is increasing industrial and scientific interesting in ultra-fast, high peak brightness, tunable energy and polarization, monochromatic hard X-ray source. The X-ray source based on the Thomson scattering between the relativistic electron beam and TW laser pulse is the suitable candidate for its compact and affordable alternatives for high brightness hard monochromatic X-ray generation. Accelerator laboratory in Tsinghua University al so proposed and built Tsinghua Thomson scattering X-ray source. The hard x-ray pulse has been generated in experiment with 47 MeV electron and 20 TW laser in this year, and the parameters of the X-ray have been measured preliminarily. The experimental results are presented and discussed in this paper.

MOPPP009	X-Ray Spectra Reconstruction of Thomson Scattering Source From Analysis of Attenuation Data	586
	Y.-C. Du, Hua, J.F. Hua, W.-H. Huang, C.-X. Tang, H.S. Xu, L.X. Yan, H. Zha, Z. Zhang TUB, Beijing, People's Republic of China
	Thomson scattering X-ray source, in which the TW laser pulse is scattered by the relativistic electron beam, can provide ultra short, monochromatic, high flux, tunable polarized hard X-ray pulse which is can widely used in physical, chemical and biological process research, ultra-fast phase contrast imaging, and so on. Since the pulse duration of X-ray is as short as picosecond and the flux in one pulse is high, it is difficult to measure the x-ray spectrum. In this paper, we present the X-ray spectrum measurement experiment on Tsinghua Thomson scattering. The preliminary experimental results shows the maximum X-ray energy is about 47 keV, which is agree well with the simulations.

TUPPD069	Schottky-Enabled Photoemission and Dark Current Measurements - Toward an Alternate Approach to Fowler-Nordheim Plot Analysis	1563
	E.E. Wisniewski, W. Gai, J.G. Power ANL, Argonne, USA H. Chen, Y.-C. Du, Hua, J.F. Hua, W.-H. Huang, C.-X. Tang, L.X. Yan, Y. You TUB, Beijing, People's Republic of China A. Grudiev, W. Wuensch CERN, Geneva, Switzerland E.E. Wisniewski Illinois Institute of Technology, Chicago, Illinois, USA
	Field-emitted dark current, a major gradient-limiting factor in RF cavities, is usually analyzed via Fowler-Nordheim (FN) plots. Traditionally, field emission is attributed to geometrical perturbations on the bulk surface whose field enhancement factor (beta) and the emitting area (A) can be extracted from the FN plot. Field enhancement factors extracted in this way are typically much too high (1 to 2 orders of magnitude) to be explainable by either the geometric projection model applied to the measured surface roughness or by field enhancement factors extracted from Schottky-enabled photoemission measurements. We compare traditional analysis of FN plots to an alternate approach employing local work function variation. This is illustrated by comparative analysis of recent dark current and Schottky-enabled photoemission data taken at Tsinghua S-band RF gun. We conclude by describing a possible experimental plan for discrimination of variation of local work function vs. local field enhancement.

Paper

Title

Page

Hard X-ray Generation Experiment at Tsinghua Thomson Scattering X-Ray Source

583

Y.-C. Du, H. Chen, Q. Du, Hua, J.F. Hua, W.-H. Huang, H.J. Qian, C.-X. Tang, H.S. Xu, L.X. Yan, Z. Zhang
TUB, Beijing, People's Republic of China

Recently, there is increasing industrial and scientific interesting in ultra-fast, high peak brightness, tunable energy and polarization, monochromatic hard X-ray source. The X-ray source based on the Thomson scattering between the relativistic electron beam and TW laser pulse is the suitable candidate for its compact and affordable alternatives for high brightness hard monochromatic X-ray generation. Accelerator laboratory in Tsinghua University al so proposed and built Tsinghua Thomson scattering X-ray source. The hard x-ray pulse has been generated in experiment with 47 MeV electron and 20 TW laser in this year, and the parameters of the X-ray have been measured preliminarily. The experimental results are presented and discussed in this paper.

MOPPP009

X-Ray Spectra Reconstruction of Thomson Scattering Source From Analysis of Attenuation Data

586

Y.-C. Du, Hua, J.F. Hua, W.-H. Huang, C.-X. Tang, H.S. Xu, L.X. Yan, H. Zha, Z. Zhang
TUB, Beijing, People's Republic of China

Thomson scattering X-ray source, in which the TW laser pulse is scattered by the relativistic electron beam, can provide ultra short, monochromatic, high flux, tunable polarized hard X-ray pulse which is can widely used in physical, chemical and biological process research, ultra-fast phase contrast imaging, and so on. Since the pulse duration of X-ray is as short as picosecond and the flux in one pulse is high, it is difficult to measure the x-ray spectrum. In this paper, we present the X-ray spectrum measurement experiment on Tsinghua Thomson scattering. The preliminary experimental results shows the maximum X-ray energy is about 47 keV, which is agree well with the simulations.

TUPPD069

Schottky-Enabled Photoemission and Dark Current Measurements - Toward an Alternate Approach to Fowler-Nordheim Plot Analysis

1563

E.E. Wisniewski, W. Gai, J.G. Power
ANL, Argonne, USA
H. Chen, Y.-C. Du, Hua, J.F. Hua, W.-H. Huang, C.-X. Tang, L.X. Yan, Y. You
TUB, Beijing, People's Republic of China
A. Grudiev, W. Wuensch
CERN, Geneva, Switzerland
E.E. Wisniewski
Illinois Institute of Technology, Chicago, Illinois, USA

Field-emitted dark current, a major gradient-limiting factor in RF cavities, is usually analyzed via Fowler-Nordheim (FN) plots. Traditionally, field emission is attributed to geometrical perturbations on the bulk surface whose field enhancement factor (beta) and the emitting area (A) can be extracted from the FN plot. Field enhancement factors extracted in this way are typically much too high (1 to 2 orders of magnitude) to be explainable by either the geometric projection model applied to the measured surface roughness or by field enhancement factors extracted from Schottky-enabled photoemission measurements. We compare traditional analysis of FN plots to an alternate approach employing local work function variation. This is illustrated by comparative analysis of recent dark current and Schottky-enabled photoemission data taken at Tsinghua S-band RF gun. We conclude by describing a possible experimental plan for discrimination of variation of local work function vs. local field enhancement.