Author: Thomas, C.A.
Paper Title Page
WEAL1 Large Aperture X-ray Monitors for Beam Profile Diagnostics 608
  • C.A. Thomas, G. Rehm
    Diamond, Oxfordshire, United Kingdom
  • F. Ewald
    ESRF, Grenoble, France
  • J.W. Flanagan
    KEK, Ibaraki, Japan
  Emittance is one of the main characteristic properties of a beam of particles in an accelerator, and it is measured generally by means of the particle beam profile. In particular, when the beam of particles is emitting an X-ray photon beam, a non perturbative way of measuring the particle beam profile is to image it using the emitted X-ray photon beam. Over the years, numerous X-ray imaging methods have been developed, fulfilling the requirements imposed by a particle beam becoming smaller, and approaching micron size for electron beam machine with vertical emittance of the order of 1pm-rad. In this paper, we will first recall the properties of the X-ray photon as function of source and its properties. From this we will derive some natural definition of a large aperture X-ray imaging system. We will then use this selection criterion to select a number of X-ray imaging devices used as a beam profile diagnostics in an attempt to give an overview of what has been achieved and what is possible to achieve with the selected devices.  
slides icon Slides WEAL1 [7.499 MB]