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WEAL1 |
Large Aperture X-ray Monitors for Beam Profile Diagnostics |
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- C.A. Thomas, G. Rehm
Diamond, Oxfordshire, United Kingdom
- F. Ewald
ESRF, Grenoble, France
- J.W. Flanagan
KEK, Ibaraki, Japan
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Emittance is one of the main characteristic properties of a beam of particles in an accelerator, and it is measured generally by means of the particle beam profile. In particular, when the beam of particles is emitting an X-ray photon beam, a non perturbative way of measuring the particle beam profile is to image it using the emitted X-ray photon beam. Over the years, numerous X-ray imaging methods have been developed, fulfilling the requirements imposed by a particle beam becoming smaller, and approaching micron size for electron beam machine with vertical emittance of the order of 1pm-rad. In this paper, we will first recall the properties of the X-ray photon as function of source and its properties. From this we will derive some natural definition of a large aperture X-ray imaging system. We will then use this selection criterion to select a number of X-ray imaging devices used as a beam profile diagnostics in an attempt to give an overview of what has been achieved and what is possible to achieve with the selected devices.
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Slides WEAL1 [7.499 MB]
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