ICALEPCS2019 - List of Authors (Vytla, V.K.)

Paper	Title	Page
TUAPP01	Hardware-in-the-Loop Testing of Accelerator Firmware	659
	C. Serrano, M. Betz, L.R. Doolittle, S. Paiagua, V.K. Vytla LBNL, Berkeley, California, USA
	Continuous Integration (CI) is widely used in industry, especially in the software world. Here we propose a combination of CI processes to run firmware and software tests both in simulation and on real hardware that can be well adapted to FPGA-based accelerator electronics designs. We have built a test rack with a variety of hardware platforms. Relying on source code version control tools, when a developer submits a change to the code base, a multi-stage test pipeline is triggered. Unit tests are run automatically, bitstreams are generated for the various supported FPGA platforms and loaded onto the FPGAs in the rack, and tests are run on hardware. Reports are generated upon test completion and notifications are sent to the developers in case of failure.
	Slides TUAPP01 [9.740 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2019-TUAPP01
About •	paper received ※ 07 October 2019 paper accepted ※ 20 October 2019 issue date ※ 30 August 2020
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

Hardware-in-the-Loop Testing of Accelerator Firmware

659

C. Serrano, M. Betz, L.R. Doolittle, S. Paiagua, V.K. Vytla
LBNL, Berkeley, California, USA

Continuous Integration (CI) is widely used in industry, especially in the software world. Here we propose a combination of CI processes to run firmware and software tests both in simulation and on real hardware that can be well adapted to FPGA-based accelerator electronics designs. We have built a test rack with a variety of hardware platforms. Relying on source code version control tools, when a developer submits a change to the code base, a multi-stage test pipeline is triggered. Unit tests are run automatically, bitstreams are generated for the various supported FPGA platforms and loaded onto the FPGAs in the rack, and tests are run on hardware. Reports are generated upon test completion and notifications are sent to the developers in case of failure.

Slides TUAPP01 [9.740 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2019-TUAPP01

About •

paper received ※ 07 October 2019 paper accepted ※ 20 October 2019 issue date ※ 30 August 2020

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)