Author: Yu, L.Y.
Paper Title Page
MOAO05 Beam Instrumentation System for Shanghai Soft X-ray FEL Test Facility 17
 
  • L.W. Lai, F.Z. Chen, J. Chen, J. Chen, W. Fang, C. Feng, B. Gao, R. Jiang, Y.B. Leng, Y.B. Yan, L.Y. Yu, R.X. Yuan, N. Zhang, W.M. Zhou, T. Shen
    SSRF, Shanghai, People’s Republic of China
  • S.S. Cao, L.F. Hua
    SINAP, Shanghai, People’s Republic of China
 
  Shanghai Soft X-ray FEL (SXFEL) test facility was designed and built to demonstrate EEHG and HGHG schemes and verify key technologies for the future hard X-ray FEL facility (SHINE). After three years commissioning 8.8 nm FEL radiation with peak power of 1 MW had been achieved at the end of 2019. The design, fabrication, commissioning and operation of BI system including Stripline-BPM, Cavity-BPM, screen monitor, bunch length monitor, beam arrival monitor, bunch energy monitor, will be introduced in this paper. Several lessons learned during design stage and beam commissioning stage will be addressed as well.  
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slides icon Slides MOAO05 [6.930 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2020-MOAO05  
About • paper received ※ 01 September 2020       paper accepted ※ 17 September 2020       issue date ※ 30 October 2020  
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THPP36 Prototype Design of Wire Scanner for SHINE 285
 
  • J. Wan
    SINAP, Shanghai, People’s Republic of China
  • F.Z. Chen, J. Chen, B. Gao, Y.B. Leng, K.R. Ye, L.Y. Yu, W.M. Zhou
    SSRF, Shanghai, People’s Republic of China
 
  SHINE is a high repetition rate XFEL facility, based on an 8 GeV CW SCRF linac, under development in Shanghai. In order to meet the requirements of measuring the beam profile of SHINE in real time and without obstruction, a new diagnostic instrument, wire scanner has been designed. This paper mainly describes the design of wire scanner in SHINE, and some simulation results are also shown and discussed.  
poster icon Poster THPP36 [1.787 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2020-THPP36  
About • paper received ※ 31 August 2020       paper accepted ※ 18 September 2020       issue date ※ 30 October 2020  
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