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@InProceedings{wan:ibic2020-thpp36, author = {J. Wan and F.Z. Chen and J. Chen and B. Gao and Y.B. Leng and K.R. Ye and L.Y. Yu and W.M. Zhou}, % author = {J. Wan and F.Z. Chen and J. Chen and B. Gao and Y.B. Leng and K.R. Ye and others}, % author = {J. Wan and others}, title = {{Prototype Design of Wire Scanner for SHINE}}, booktitle = {Proc. IBIC'20}, pages = {285--287}, paper = {THPP36}, language = {english}, keywords = {detector, simulation, FEL, electron, controls}, venue = {Santos, Brazil}, series = {International Beam Instrumentation Conference}, number = {9}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {10}, year = {2020}, issn = {2673-5350}, isbn = {978-3-95450-222-6}, doi = {10.18429/JACoW-IBIC2020-THPP36}, url = {https://www.jacow.org/ibic2020/papers/thpp36.pdf}, note = {https://doi.org/10.18429/JACoW-IBIC2020-THPP36}, abstract = {SHINE is a high repetition rate XFEL facility, based on an 8 GeV CW SCRF linac, under development in Shanghai. In order to meet the requirements of measuring the beam profile of SHINE in real time and without obstruction, a new diagnostic instrument, wire scanner has been designed. This paper mainly describes the design of wire scanner in SHINE, and some simulation results are also shown and discussed.}, }