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BiBTeX citation export for THPP36: Prototype Design of Wire Scanner for SHINE

@InProceedings{wan:ibic2020-thpp36,
  author       = {J. Wan and F.Z. Chen and J. Chen and B. Gao and Y.B. Leng and K.R. Ye and L.Y. Yu and W.M. Zhou},
% author       = {J. Wan and F.Z. Chen and J. Chen and B. Gao and Y.B. Leng and K.R. Ye and others},
% author       = {J. Wan and others},
  title        = {{Prototype Design of Wire Scanner for SHINE}},
  booktitle    = {Proc. IBIC'20},
  pages        = {285--287},
  paper        = {THPP36},
  language     = {english},
  keywords     = {detector, simulation, FEL, electron, controls},
  venue        = {Santos, Brazil},
  series       = {International Beam Instrumentation Conference},
  number       = {9},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {10},
  year         = {2020},
  issn         = {2673-5350},
  isbn         = {978-3-95450-222-6},
  doi          = {10.18429/JACoW-IBIC2020-THPP36},
  url          = {https://www.jacow.org/ibic2020/papers/thpp36.pdf},
  note         = {https://doi.org/10.18429/JACoW-IBIC2020-THPP36},
  abstract     = {SHINE is a high repetition rate XFEL facility, based on an 8 GeV CW SCRF linac, under development in Shanghai. In order to meet the requirements of measuring the beam profile of SHINE in real time and without obstruction, a new diagnostic instrument, wire scanner has been designed. This paper mainly describes the design of wire scanner in SHINE, and some simulation results are also shown and discussed.},
}