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TY - CONF AU - Wan, J. AU - Chen, F.Z. AU - Chen, J. AU - Gao, B. AU - Leng, Y.B. AU - Ye, K.R. AU - Yu, L.Y. AU - Zhou, W.M. ED - Tavares, Daniel ED - Picoreti, Renan ED - Bruno, Gustavo ED - Marques, Sergio ED - Schaa, Volker R.W. TI - Prototype Design of Wire Scanner for SHINE J2 - Proc. of IBIC2020, Santos, Brazil, 14-18 September 2020 CY - Santos, Brazil T2 - International Beam Instrumentation Conference T3 - 9 LA - english AB - SHINE is a high repetition rate XFEL facility, based on an 8 GeV CW SCRF linac, under development in Shanghai. In order to meet the requirements of measuring the beam profile of SHINE in real time and without obstruction, a new diagnostic instrument, wire scanner has been designed. This paper mainly describes the design of wire scanner in SHINE, and some simulation results are also shown and discussed. PB - JACoW Publishing CP - Geneva, Switzerland SP - 285 EP - 287 KW - detector KW - simulation KW - FEL KW - electron KW - controls DA - 2020/10 PY - 2020 SN - 2673-5350 SN - 978-3-95450-222-6 DO - doi:10.18429/JACoW-IBIC2020-THPP36 UR - https://www.jacow.org/ibic2020/papers/thpp36.pdf ER -