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| THPP36 |
Prototype Design of Wire Scanner for SHINE |
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- J. Wan
SINAP, Shanghai, People’s Republic of China
- F.Z. Chen, J. Chen, B. Gao, Y.B. Leng, K.R. Ye, L.Y. Yu, W.M. Zhou
SSRF, Shanghai, People’s Republic of China
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SHINE is a high repetition rate XFEL facility, based on an 8 GeV CW SCRF linac, under development in Shanghai. In order to meet the requirements of measuring the beam profile of SHINE in real time and without obstruction, a new diagnostic instrument, wire scanner has been designed. This paper mainly describes the design of wire scanner in SHINE, and some simulation results are also shown and discussed.
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Poster THPP36 [1.787 MB]
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| DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-IBIC2020-THPP36
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| About • |
paper received ※ 31 August 2020 paper accepted ※ 18 September 2020 issue date ※ 30 October 2020 |
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