Author: Walasek-Hoehne, B.    [Walasek-Höhne, B.]
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TUAO04
Investigation of Novel Radiation Hard and Fast Scintillator for Heavy Ions Detection  
 
  • M. Saifulin, P. Boutachkov, P. Simon, C. Trautmann, B. Walasek-Höhne
    GSI, Darmstadt, Germany
  • E.I. Gorokhova
    GOI, St Petersburg, Russia
  • P. Rodnyi, I.D. Venevtsev
    SPbPU, St. Petersburg, Russia
 
  ZnO is a well known semiconductor material, that has found application in many fields of technology: phosphors, scintillators, varistors, gas sensors, etc*. Recently it was found that fast near-band-edge luminescence in ZnO ceramics can be significantly enhanced by introducing In3+ and Ga3+ impurities**. Due to this property, doped ZnO is of great interest for fast counting applications, in particular for beam diagnostics application at future FAIR facility***. In this contribution, we present the results of swift heavy ion induced luminescence measurements of ZnO(In) ceramics performed at GSI. Samples were irradiated with 4.8 MeV/u 48Ca and 197Au ions up to fluences of 5·10+12 and 2·10+11 ion/cm2 respectively. Iono-luminescence spectra were monitored on-line as a function of fluence. ZnO(In) and ZnO(Ga) ceramics demonstrate several orders of magnitude higher radiation hardness than plastic scintillators. This investigation is part of a larger research program for beam intensity, spill structure and beam profile measurements with ZnO fast scintillators.
* Klingshirn et al., Phys. Stat. Solidi B, Vol.247, No.6, (2010), 1424-1447
** Rodnyi et al., IEEE T.Nucl. Sci. Vol.59, No.5, (2012), 2152-2155
*** Boutachkov et al., Proceedings of IBIC19, (2019)
 
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TUPP21
Transition Radiation Based Diagnostics for Non-Relativistic Ion Beams  
 
  • R. Singh, T. Reichert, B. Walasek-Höhne
    GSI, Darmstadt, Germany
 
  The usage of optical transition radiation for profile monitoring of non-relativistic electron beams is well known. In this contribution, we study the application of transition radiation in optical and GHz regime for non-relativistic ion beams. The light emitted from a metal target after ion beam irradiation consists of polarized transition radiation as well as significant amount of unpolarized photons. The dependence of light yield on beam current and comparison of measured transverse profiles with alternative devices is shown. Simulations and pilot measurements demonstrating the potential usage of coherent transition radiation in GHz regime for bunch-by-bunch longitudinal profile measurements is also discussed.  
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