IBIC2019 - List of Authors (Orlandi, G.L.)

Paper	Title	Page
MOPP046	Electron Beam Diagnostics for SLS2.0
	C. Ozkan Loch, R. Ischebeck, G.L. Orlandi, V. Schlott, A. Streun PSI, Villigen PSI, Switzerland
	In the near future the SLS storage ring will be upgraded for significantly higher brightness and coherence. Although the upgrade will require similar instrumentation to that already implemented for current SLS operation, significant changes in the number of devices, their specifications and their technical realizations will have to be made according to the specific requirements of SLS 2.0, using the newly available technologies and standardizations at PSI. This poster will provide an overview of the design, technical specifications, implementation and expected challenges of these systems. The beam position monitors and fast-orbit feedbacks are not included in this presentation.
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TUBO02	FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.	249
	G.L. Orlandi, S. Borrelli, Ch. David, E. Ferrari, V. Guzenko, B. Hermann, O. Huerzeler, R. Ischebeck, C. Lombosi, C. Ozkan Loch, E. Prat PSI, Villigen PSI, Switzerland N. Cefarin, S. Dal Zilio, M. Lazzarino IOM-CNR, Trieste, Italy M. Ferianis, G. Penco, M. Veronese Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Italy
	Wire-scanners with micrometer resolution are in operation at SwissFEL and FERMI for measurements of the beam emittance and for beam profile monitoring (,). In addition, both laboratories are developing and testing innovative nano-fabricated wire-scanners capable of providing sub-micrometer resolution and being quasi non-destructive to the beam. Nano-fabricated wire-scanners with a free-standing design () and a sub-micrometer resolution (*) has been already successfully tested. In the present work, innovative nano-fabricated wire-scanners joining both features of a free-standing design and sub-micrometer resolution are presented. Experimental tests carried out at SwissFEL demonstrated the capability of such innovative wire-scanner solutions to resolve transverse profiles of the electron beams with a size of 400-500 nm without incurring in any resolution limit constraint and with a minimal beam perturbation. An overview on current status and results along with future developments of these nano-fabricated wire-scanners are here presented. ()G.L.Orlandi et al. PRAB 19, 092802 (2016). ()M.Veronese et al.this Conference. ()M.Veronese et al.NIM-A 891, 32-36, (2018) (***)S.Borrelli et al. Comm. Phys.-Nature, 1, 52 (2018).
	Slides TUBO02 [10.551 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-TUBO02
About •	paper received ※ 04 September 2019 paper accepted ※ 07 September 2019 issue date ※ 10 November 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

MOPP046

Electron Beam Diagnostics for SLS2.0

C. Ozkan Loch, R. Ischebeck, G.L. Orlandi, V. Schlott, A. Streun
PSI, Villigen PSI, Switzerland

In the near future the SLS storage ring will be upgraded for significantly higher brightness and coherence. Although the upgrade will require similar instrumentation to that already implemented for current SLS operation, significant changes in the number of devices, their specifications and their technical realizations will have to be made according to the specific requirements of SLS 2.0, using the newly available technologies and standardizations at PSI. This poster will provide an overview of the design, technical specifications, implementation and expected challenges of these systems. The beam position monitors and fast-orbit feedbacks are not included in this presentation.

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reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

TUBO02

FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.

249

G.L. Orlandi, S. Borrelli, Ch. David, E. Ferrari, V. Guzenko, B. Hermann, O. Huerzeler, R. Ischebeck, C. Lombosi, C. Ozkan Loch, E. Prat
PSI, Villigen PSI, Switzerland
N. Cefarin, S. Dal Zilio, M. Lazzarino
IOM-CNR, Trieste, Italy
M. Ferianis, G. Penco, M. Veronese
Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Italy

Wire-scanners with micrometer resolution are in operation at SwissFEL and FERMI for measurements of the beam emittance and for beam profile monitoring (*,**). In addition, both laboratories are developing and testing innovative nano-fabricated wire-scanners capable of providing sub-micrometer resolution and being quasi non-destructive to the beam. Nano-fabricated wire-scanners with a free-standing design (***) and a sub-micrometer resolution (****) has been already successfully tested. In the present work, innovative nano-fabricated wire-scanners joining both features of a free-standing design and sub-micrometer resolution are presented. Experimental tests carried out at SwissFEL demonstrated the capability of such innovative wire-scanner solutions to resolve transverse profiles of the electron beams with a size of 400-500 nm without incurring in any resolution limit constraint and with a minimal beam perturbation. An overview on current status and results along with future developments of these nano-fabricated wire-scanners are here presented.
(*)G.L.Orlandi et al. PRAB 19, 092802 (2016).
(**)M.Veronese et al.this Conference.
(***)M.Veronese et al.NIM-A 891, 32-36, (2018)
(****)S.Borrelli et al. Comm. Phys.-Nature, 1, 52 (2018).

Slides TUBO02 [10.551 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-TUBO02

About •

paper received ※ 04 September 2019 paper accepted ※ 07 September 2019 issue date ※ 10 November 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)