SRF2017 - List of Authors (Stevie, F.A.)

Paper	Title	Page
THPB036	Fundamental SIMS Analyses for Nitrogen-enriched Niobium	821
	J. Tuggle, M.J. Kelley Virginia Polytechnic Institute and State University, Blacksburg, USA M.J. Kelley, U. Pudasaini The College of William and Mary, Williamsburg, Virginia, USA M.J. Kelley, A.D. Palczewski, C.E. Reece JLab, Newport News, Virginia, USA F.A. Stevie NCSU AIF, Raleigh, North Carolina, USA
	Funding: Co-Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177. W&M and VT work supported by the Office of High Energy Physics, U.S. DOE under grant DE-SC-0014475 In order to fully understand nitrogen addition techniques it is vital to have a full understanding of the material, including the content, location, and speciation of nitrogen contained in the treated Nb. In this work Secondary Ion Mass Spectrometry (SIMS) is used to elucidate content and location. Dynamic SIMS nitrogen analysis is reported, for the first time, for "as-received" cavity grade niobium from three separate suppliers. In addition, a number of method and instrumental issues are discussed including depth resolution, detection limit, and quantification.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2017-THPB036
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Paper

Title

Page

Fundamental SIMS Analyses for Nitrogen-enriched Niobium

821

J. Tuggle, M.J. Kelley
Virginia Polytechnic Institute and State University, Blacksburg, USA
M.J. Kelley, U. Pudasaini
The College of William and Mary, Williamsburg, Virginia, USA
M.J. Kelley, A.D. Palczewski, C.E. Reece
JLab, Newport News, Virginia, USA
F.A. Stevie
NCSU AIF, Raleigh, North Carolina, USA

Funding: Co-Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177. W&M and VT work supported by the Office of High Energy Physics, U.S. DOE under grant DE-SC-0014475
In order to fully understand nitrogen addition techniques it is vital to have a full understanding of the material, including the content, location, and speciation of nitrogen contained in the treated Nb. In this work Secondary Ion Mass Spectrometry (SIMS) is used to elucidate content and location. Dynamic SIMS nitrogen analysis is reported, for the first time, for "as-received" cavity grade niobium from three separate suppliers. In addition, a number of method and instrumental issues are discussed including depth resolution, detection limit, and quantification.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-SRF2017-THPB036

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)