Author: Satoh, M.
Paper Title Page
THAA06 Precise Studies on He-Processing and HPR for Recovery From Field Emission by Using X-Ray Mapping System 1019
 
  • H. Sakai, K. Enami, T. Furuya, M. Satoh, K. Shinoe, K. Umemori
    KEK, Ibaraki, Japan
  • M. Sawamura
    JAEA, Ibaraki-ken, Japan
 
  We usually met the degradation of superconducting RF cavity on the cryomodule test and beam operation even if the performance of this cavity is good on the vertical test (V.T). Field emission is the most severe problem for this degradation after reassembly work from vertical test. Not only high pressure rinsing (HPR) but also He-processing, which is more suitable method without the reassembly work for recovery, is recommended and tried to recover this degradation. However, we did not investigate the details of how field emission sources were processed and removed after HPR and He-processing. We deeply investigated the processing procedure during He-processing and how many field emission sources removed after HPR by using rotating X-ray mapping system* in V.T .
*H.Sakai et.al., Proc. of IPAC10 p2950-2952.
 
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