Paper |
Title |
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TUPSA58 |
A Method for Measuring the Positron Lifetime in Solid Matter with a Continuous Positron Beam |
267 |
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- A.A. Sidorin, E.V. Ahmanova, A.G. Kobets, V.V. Kobets, I.N. Meshkov, O. Orlov
JINR, Dubna, Moscow Region, Russia
- M.K. Eseev
NArFU, Arhangelsk, Russia
- V.I. Hilinov, P. Horodek, I.N. Meshkov, K. Siemek
JINR/DLNP, Dubna, Moscow region, Russia
- P. Horodek, K. Siemek
IFJ-PAN, Kraków, Poland
- A.G. Kobets
IERT, Kharkov, Ukraine
- I.N. Meshkov
Saint Petersburg State University, Saint Petersburg, Russia
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The report proposes the scheme and design of the setup for formation a continuous monochromatic positron flux with controlled time of arrival at the target, independent of the injection time in a limited time interval. The setup is designed to perform experiments to measure the positron lifetime with the positron annihilation spectroscopy method (Positron Annihilation Lifetime Spectroscopy - PALS). PALS method allows to distinguish defect types in the materials. It is possible to vary the positron energy in the present version of the setup that allows us to analyze the distribution of defects along the depth of the sample. The scheme of periodic RF voltage generation of a given form and measurement of the positron lifetime, is discussed.
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DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-RUPAC2018-TUPSA58
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TUPSA59 |
Setup for Secondary Electron-Electron Emission Coefficient Study |
270 |
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- O. Orlov, A.G. Kobets, I.N. Meshkov, A.A. Sidorin
JINR, Dubna, Moscow Region, Russia
- V.I. Hilinov
JINR/DLNP, Dubna, Moscow region, Russia
- A.G. Kobets
IERT, Kharkov, Ukraine
- I.N. Meshkov
Saint Petersburg State University, Saint Petersburg, Russia
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Setup for measurement of secondary electron yield from metal surfaces and other materials is developed. This work is related to the known problem of electron cloud formation in the synchrotron vacuum chamber during the beam passage. It is planned to measure the dependence of the SEY on the chamber material type and the structure of the surface of the chamber wall. The developed device allows us to register the spectrum of secondary electrons.
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DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-RUPAC2018-TUPSA59
|
|
Export • |
reference for this paper using
※ BibTeX,
※ LaTeX,
※ Text/Word,
※ RIS,
※ EndNote (xml)
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