SAIC, Burlington, Massachusetts
NRL, Washington, DC
Low emittance, high current density sources are required to achieve the small beam size needed for high frequency vacuum electronic devices and for high power free electron lasers (FELs). Emission models are of particular importance in the emittance-dominated regime, where emission non-uniformity and surface structure of the cathode can have an impact on beam characteristics. We have been developing comprehensive time-dependent photoemission models for the simulation codes that account for laser and cathode material and surface characteristics. MICHELLE* is NRL's finite-element self-consistent electrostatic time-domain code: it has the ability to import an RF field, and has unique capabilities for modeling the emission and the self fields, near the cathode. In particular, some instances of surface irregularities and emission non-uniformity (due to work function variation) leading to such effects as beam emittance and high frequency oscillations are possible to model due to the code's conformal meshing capabilities. We will present results of the implementation of the 'next generation' photoemission models in the MICHELLE code for modeling surface roughness and non-uniformity.
* John Petillo, et al., "The MICHELLE Three-Dimensional Electron and Collector Modeling Tool: Theory and Design", IEEE Trans. Plasma Sci., vol. 30, no. 3, June 2002, pp. 1238-1264.
NRL, Washington, DC
UMD, College Park, Maryland
LANL, Los Alamos, New Mexico
SAIC, Burlington, Massachusetts
A recently developed model* of the emittance and brightness of a photocathode based on the evaluation of the moments of the electron emission distribution function admits an analytical solution for the zero-field and zero-temperature asymptotic model. Here, the model has been extended to account for the critical modifications of temperature and field dependence, which are tied to material issues with the cathode. Temperature impacts the nature of scattering within the photoemitter material and therefore affects quantum efficiency significantly. Field changes the emission probability at the surface barrier, and is particularly important for low work function coatings, as occur for the cesiated surfaces characteristic of our controlled porosity dispenser photocathodes. Extensions of the theoretical models shall be given, followed by an analysis of their comparison with numerical simulations of the intrinsic emittance and brightness of a photocathode. The methodology is designed to facilitate the development of photoemission models into comprehensive particle-in-cell (PIC) codes to address issues otherwise not readily treated, e.g., variation in surface coverage and topology.
* K. L. Jensen, P. G. O'Shea, D. W. Feldman, and N. A. Moody, Applied Physics Letters 89, 224103 (2006).
LLNL, Livermore, California
STAR, Inc., Mequon
SAIC, Burlington, Massachusetts
Particle orbit errors in multipacting and dark current computations can arise from inadequate field representation, poor surface modeling, and from the integration algorithm used to advance the particles. Established fields-based adaptive mesh refinement (AMR) methods *,** selectively improve the field and surface representation over several iterations in finite-element codes but they are not optimized for particle tracking. In particular, field emission and secondary emission models require precise surface representations and highly accurate field representations near surfaces, and these requirements are not adequately addressed in standard AMR techniques. In this paper we report on extensions to existing AMR support in the Analyst software package for particle tracking, including adaptive improvement of near-surface and on-surface field representations, and control of element aspect ratios throughout successive iterations. We also discuss the merits of automated identification of important regions of the mesh based on field levels and orbit estimation to guide AMR in multipacting calculations, and multipacting results for a SRF cavity will be presented.
* G. Drago, et al., IEEE Trans. on Mag., 28, 1992, pp. 1743-1746.** D. K. Sun, et al., IEEE Trans. on Mag., 36, July 2000, pp. 1596-1599.