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Tanke, E.

Paper Title Page
RPAT063 A Bunch-By-Bunch and Turn-By-Turn Instrumentation Hardware Upgrade for CESR-c 3597
 
  • M.A. Palmer, J. Dobbins, C.R. Strohman, E. Tanke
    CESR-LEPP, Ithaca, New York
 
  Funding: Work supported by the National Science Foundation.

A key factor in the colliding beam performance of the Cornell Electron Storage Ring (CESR) is the impact of parasitic beam-beam interactions between bunches in the two beams as they follow their electrostatically separated orbits in a single vacuum chamber. In order to better investigate the differential performance of bunches in CESR, instrumentation electronics has been developed to allow acquisition of turn-by-turn data from multiple bunches simultaneously. The electronics consists of a standardized digital board centered around an Analog Devices TigerSHARC family digital signal processor, a communications interface, and an interface to the CESR Precision Timing System. Mated to these components is an analog front end and digitizer board which is customized for the particular diagnostic device of interest. Front ends have been developed for beam position monitor, luminosity monitor, and beam profile monitor applications. We describe the design and characterization of this new hardware.