Keyword: free-electron-laser
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TUPLE13 Analytical Thermal Analysis of Thin Diamond in High-Intensity High-Repetition-Rate Application laser, FEL, electron, operation 587
 
  • Y. Hong, B. Yang
    University of Texas at Arlington, Arlington, USA
  • J. Wu, G. Zhou
    SLAC, Menlo Park, California, USA
 
  Thin diamond plates are used in monochromator for X-ray Free-Electron Laser self-seeding scheme. To function properly, they must endure high-intensity and high-repetition-rate laser pulses without crossing thresholds set by various adverse effects, such as thermal strain-induced diffraction distortion and graphitization. In this work, a theoretical model is developed, and an analytical solution is derived to elucidate potential thermal runaway under edge cooling condition. It is shown that the crystal edge cooling can effectively mitigate the issue to a certain extent. The analytical solution can be used as an efficient tool for XFEL operation parameter setup.  
poster icon Poster TUPLE13 [0.939 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-NAPAC2019-TUPLE13  
About • paper received ※ 27 August 2019       paper accepted ※ 06 September 2019       issue date ※ 08 October 2019  
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FRCHC2 Possibilities for Future Synchrotron Radiation Sources electron, laser, FEL, radiation 1000
 
  • M.-E. Couprie
    SOLEIL, Gif-sur-Yvette, France
 
  The landscape of present accelerator based light sources is drawn. The photon beam brightness increases opens new areas of user applications, both with the arrival of low emittance rings getting closer to diffraction limit and the advent of X-ray Free Electron Lasers, providing agility in terms of performance (two colors, attosecond pulse…). Finally, the path towards light sources using alternate accelerator schemes, such as plasma acceleration is discussed.  
slides icon Slides FRCHC2 [76.897 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-NAPAC2019-FRCHC2  
About • paper received ※ 04 September 2019       paper accepted ※ 16 November 2020       issue date ※ 08 October 2019  
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