Author: Levcenco, S.
Paper Title Page
WEPPP006
 Setup for a Combined XEOL and XAFS Spectroscopy Measurement at the X-Ray Absorption Spectroscopy Beamline P65 of Petra III  
 
  • R. Biller, E. Welter
    DESY, Hamburg, Germany
  • S. Levcenco, C.S. Schnohr
    Leipzig University, Felix Bloch Institute for Solid State Physics, Leipzig, Germany
  
  A re­cently de­signed setup to per­form steady-state X-ray ex­cited op­ti­cal lu­mi­nes­cence (XEOL) spec­troscopy and si­mul­ta­ne­ous X-ray ab­sorp­tion fine struc­ture (XAFS) char­ac­ter­i­za­tion at the beam­line P65 of PETRA III is de­scribed. The so-named XEOL setup is equipped with a cus­tomized He­lium-flow cryo­stat and a state of-the-art op­ti­cal de­tec­tion sys­tem, which cov­ers a wide wave­length range from near-in­frared (NIR), vis­i­ble (VIS) and ul­tra­vi­o­let (UV) wave­length ranges. The cryostats’ and vac­uum cham­bers’ de­sign re­quired spe­cial lay­outs and de­sign due to cer­tain geo­met­ri­cal con­straints which was chal­leng­ing to re­al­ize. The re­sult of the now im­ple­mented as­sem­bly make two mea­sur­ing meth­ods si­mul­ta­ne­ously pos­si­ble. First case stud­ies show the ex­per­i­ments¿ suc­cess. The main ad­van­tage of the elab­o­rated setup is that it does not re­quire mod­i­fi­ca­tion of ei­ther the sam­ple align­ment or the basic in­stru­ments at the beam­line P65. The XAFS-XEOL setup, cov­er­ing wide spec­tral and tem­per­a­ture ranges, is avail­able for the user ex­per­i­ments and we ex­pect that fu­ture stud­ies will pro­vide valu­able in­for­ma­tion about fine struc­tures of a broad range of ma­te­ri­als.  
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