JACoW is a publisher in Geneva, Switzerland that publishes the proceedings of accelerator conferences held around the world by an international collaboration of editors.
@unpublished{biller:medsi2023-weppp006,
author = {R. Biller and S. Levcenco and C.S. Schnohr and E. Welter},
title = {{Setup for a Combined XEOL and XAFS Spectroscopy Measurement at the X-Ray Absorption Spectroscopy Beamline P65 of Petra III}},
% booktitle = {Proc. MEDSI'23},
booktitle = {Proc. Int. Conf. Mech. Eng. Design Synchrotron Radiat. Equip. Instrum. (MEDSI'23)},
eventdate = {2023-11-06/2023-11-10},
language = {english},
intype = {presented at the},
series = {International Conference on Mechanical Engineering Design of Synchrotron Radiation Equipment and Instrumentation},
number = {12},
venue = {Beijing, China},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {07},
year = {2024},
note = {presented at MEDSI'23 in Beijing, China, unpublished},
abstract = {{A recently designed setup to perform steady-state X-ray excited optical luminescence (XEOL) spectroscopy and simultaneous X-ray absorption fine structure (XAFS) characterization at the beamline P65 of PETRA III is described. The so-named XEOL setup is equipped with a customized Helium-flow cryostat and a state of-the-art optical detection system, which covers a wide wavelength range from near-infrared (NIR), visible (VIS) and ultraviolet (UV) wavelength ranges. The cryostats’ and vacuum chambers’ design required special layouts and design due to certain geometrical constraints which was challenging to realize. The result of the now implemented assembly make two measuring methods simultaneously possible. First case studies show the experiments¿ success. The main advantage of the elaborated setup is that it does not require modification of either the sample alignment or the basic instruments at the beamline P65. The XAFS-XEOL setup, covering wide spectral and temperature ranges, is available for the user experiments and we expect that future studies will provide valuable information about fine structures of a broad range of materials.}},
}