| Paper | Title | Page |
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| THPPP003 | FEM Simulations for a High Heat Load Mirror | 274 |
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At the variable polarization XUV beamline P04 of PETRA III the first mirror is used to switch the beam between the two branches of the beamline. The heat load on this white beam mirror is dependent on the degree of polarization and the energy of the first harmonic of the synchrotron radiation. For this project the water cooled "notched" mirror approach by Khounsary* and Zhang et al.** has been evaluated with FEM simulations. These show promising results for linear horizontal (LH) polarization in which the heat load profile is aligned with the mirror length. For linear vertical (LV) polarization the heat load is concentrated in the mirror centre, which violates the basic concept of the "notched" mirror design and therefore the simulation results indicate only poor performance. To compensate for this a secondary cooling loop has been implemented and will be shown to improve the performance for the LV case significantly. Additionally, a new design approach is evaluated to reduce the peak temperatures of the mirror, which otherwise ranged at 140-180°C.
* Khounsary, A.M., Proc. SPIE 3773, X-Ray Opt. Des., (1999). 10.1117/12.370114 ** Zhang, L. et al., J. Phys.: Conf. Ser. 425, 052029 (2013). 10.1088/1742-6596/425/5/052029. |
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Poster THPPP003 [1.369 MB] | |
| DOI • | reference for this paper ※ doi:10.18429/JACoW-MEDSI2023-THPPP003 | |
| About • | Received ※ 24 October 2023 — Revised ※ 05 November 2023 — Accepted ※ 08 November 2023 — Issued ※ 28 May 2024 | |
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THPPP025 |
Commissioning of the Intermediate Focus Setup at P04 at DESY | |
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| The soft x-ray beamline P04 at PETRA III includes an experiment and beam-diagnostic station called Intermediate Focus (IF). The station holds an experimental station for soft x-ray scattering, as well as diagnostic and beam shaping equipment to propagate the beam further into the ASPHERE III setup of the University of Kiel (CAU). The IF station receives the beam over a pair of Kirkpatrick-Baez (KB) mirrors that produce 40 µm x 40 µm beam spot at the IF position. An additional set of KB mirrors inside the ASPHERE III instrument refocuses this spot into the ultimate focus. Among the beam shaping equipment, a set of interchangeable pinhole serve as a new source point. With a size between 5-100 µm they will produce a sub-micron beam size, which is less than 1 µm x 1 µm at the sample position. The IF station includes two features that will be presented: (a) A UHV switchyard that allows to bring either the scattering instrument or the beam shaper into the beam (collaboration with Max-Born-Institute Berlin). The switch between the setups works without breaking the vacuum. (b) The beam diagnostic and shaping assembly, including measurement and viewing components. | ||
| Cite • | reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml) | |